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Results:
1-7
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Results: 7
Authors:
HEISIG S
DANZEBRINK HU
LEYK A
MERTIN W
MUNSTER S
OESTERSCHULZE E
Citation: S. Heisig et al., MONOLITHIC GALLIUM-ARSENIDE CANTILEVER FOR SCANNING NEAR-FIELD MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 99-105
Authors:
LEYK A
KUBALEK E
Citation: A. Leyk et E. Kubalek, HIGH SPATIALLY-RESOLVED MMIC-INTERNAL MILLIMETER-WAVE MEASUREMENTS OFSINUSOIDAL SIGNALS BY HIGH-FREQUENCY ELECTRIC FORCE MICROSCOPE-TESTING, Electronics Letters, 34(2), 1998, pp. 196-198
Authors:
LEYK A
VANWAASEN S
TEGUDE FJ
KUBALEK E
Citation: A. Leyk et al., MMIC IN-CIRCUIT AND IN-DEVICE TESTING WITH AN ON-WAFER HIGH-FREQUENCYELECTRIC FORCE MICROSCOPE TEST SYSTEM, Microelectronics and reliability, 37(10-11), 1997, pp. 1575-1578
Authors:
LEYK A
KUBALEK E
Citation: A. Leyk et E. Kubalek, 2-DIMENSIONAL MEASUREMENTS OF MICROWAVE VOLTAGE-AMPLITUDE AND PHASE DISTRIBUTIONS WITHIN A MONOLITHIC INTEGRATED INTERDIGITAL CAPACITOR WITH A HIGH-FREQUENCY SCANNING FORCE MICROSCOPE TEST SYSTEM, Microelectronic engineering, 31(1-4), 1996, pp. 187-194
Authors:
LEYK A
KUBALEK E
Citation: A. Leyk et E. Kubalek, MMIC INTERNAL ELECTRIC-FIELD MAPPING WITH SUBMICROMETER SPATIAL-RESOLUTION AND GIGAHERTZ BANDWIDTH BY MEANS OF HIGH-FREQUENCY SCANNING FORCE MICROSCOPE TESTING, Electronics Letters, 31(24), 1995, pp. 2089-2091
Authors:
LEYK A
BOHM C
VANDERWEIDE DW
KUBALEC E
Citation: A. Leyk et al., 104GHZ SIGNALS MEASURED BY HIGH-FREQUENCY SCANNING FORCE MICROSCOPE TEST SYSTEM, Electronics Letters, 31(13), 1995, pp. 1046-1047
Authors:
MERTIN W
LEYK A
TAENZLER F
NOVAK T
DAVID G
JAGER D
KUBALEK E
Citation: W. Mertin et al., CHARACTERIZATION OF A MMIC BY DIRECT AND INDIRECT ELECTROOPTIC SAMPLING AND BY NETWORK ANALYZER MEASUREMENTS, Microelectronic engineering, 24(1-4), 1994, pp. 377-384
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