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Results: 1-14 |
Results: 14
PROBE-BEAM INCIDENCE ANGLE-EFFECTS ON THERMAL-DIFFUSIVITY MEASUREMENTBY PHOTOTHERMAL DEFLECTION TECHNIQUE
Authors: BERTOLOTTI M LIAKHOU GL VOTI RL PAOLONI S SIBILIA C
Citation: M. Bertolotti et al., PROBE-BEAM INCIDENCE ANGLE-EFFECTS ON THERMAL-DIFFUSIVITY MEASUREMENTBY PHOTOTHERMAL DEFLECTION TECHNIQUE, Applied physics. B, Lasers and optics, 67(5), 1998, pp. 641-646
THERMAL-WAVE RESONATOR - IN-SITU INVESTIGATION BY PHOTOTHERMAL DEFLECTION TECHNIQUE
Authors: BERTOLOTTI M LIAKHOU GL LIVOTI R PAOLONI S SIBILIA C
Citation: M. Bertolotti et al., THERMAL-WAVE RESONATOR - IN-SITU INVESTIGATION BY PHOTOTHERMAL DEFLECTION TECHNIQUE, International journal of thermophysics, 19(2), 1998, pp. 603-613
ANALYSIS OF THE PHOTOTHERMAL DEFLECTION TECHNIQUE IN THE SURFACE REFLECTION SCHEME - THEORY AND EXPERIMENT
Authors: BERTOLOTTI M LIAKHOU GL LIVOTI R PAOLONI S SIBILIA C
Citation: M. Bertolotti et al., ANALYSIS OF THE PHOTOTHERMAL DEFLECTION TECHNIQUE IN THE SURFACE REFLECTION SCHEME - THEORY AND EXPERIMENT, Journal of applied physics, 83(2), 1998, pp. 966-982
THERMAL-DIFFUSIVITY OF POWDER AGGREGATES
Authors: BERTOLOTTI M VOTI RL PAOLONI S SIBILIA C LIAKHOU GL
Citation: M. Bertolotti et al., THERMAL-DIFFUSIVITY OF POWDER AGGREGATES, Progress in Natural Science, 6, 1996, pp. 269-272
THICKNESS MEASUREMENT BY PHOTOTHERMAL DEFLECTION METHOD - BASIC INFLUENCE OF SURFACE CONDUCTANCE
Authors: BERTOLOTTI M VOTI RL PAOLONI S SIBILIA C LIAKHOU GL
Citation: M. Bertolotti et al., THICKNESS MEASUREMENT BY PHOTOTHERMAL DEFLECTION METHOD - BASIC INFLUENCE OF SURFACE CONDUCTANCE, Progress in Natural Science, 6, 1996, pp. 309-312
LOW-TEMPERATURE THERMAL-DIFFUSIVITY MEASUREMENTS
Authors: BERTOLOTTI M VOTI RL PAOLONI S SIBILIA C LIAKHOU GL
Citation: M. Bertolotti et al., LOW-TEMPERATURE THERMAL-DIFFUSIVITY MEASUREMENTS, Progress in Natural Science, 6, 1996, pp. 327-329
ANALYSIS OF THE PHOTOTHERMAL DEFLECTION METHOD IN THE BOUNCING SCHEME
Authors: BERTOLOTTI M FALABELLA A VOIT RL PAOLONI S SIBILIA C LIAKHOU GL
Citation: M. Bertolotti et al., ANALYSIS OF THE PHOTOTHERMAL DEFLECTION METHOD IN THE BOUNCING SCHEME, Progress in Natural Science, 6, 1996, pp. 665-668
TEMPERATURE-MEASUREMENT BY OPTICAL BEAM DEFLECTION METHOD
Authors: BERTOLOTTI M VOTI RL PAOLONI S SIBILIA C LIAKHOU GL
Citation: M. Bertolotti et al., TEMPERATURE-MEASUREMENT BY OPTICAL BEAM DEFLECTION METHOD, Progress in Natural Science, 6, 1996, pp. 669-672
THERMAL CHARACTERIZATION BY PHOTODEFLECTION METHOD
Authors: BERTOLOTTI M LIAKHOU GL LIVOTI R SIBILIA C
Citation: M. Bertolotti et al., THERMAL CHARACTERIZATION BY PHOTODEFLECTION METHOD, Journal of thermal analysis, 47(1), 1996, pp. 51-65
AN EXPERIMENTAL AND THEORETICAL-ANALYSIS OF THE TEMPERATURE PROFILE IN SEMICONDUCTOR-LASER DIODES USING THE PHOTODEFLECTION TECHNIQUE
Authors: BERTOLOTTI M LIAKHOU GL VOTI RL WANG RP SIBILIA C SYRBU AV YAKOVLEV VP
Citation: M. Bertolotti et al., AN EXPERIMENTAL AND THEORETICAL-ANALYSIS OF THE TEMPERATURE PROFILE IN SEMICONDUCTOR-LASER DIODES USING THE PHOTODEFLECTION TECHNIQUE, Measurement science & technology, 6(9), 1995, pp. 1278-1290
THERMAL ANISOTROPY OF POLYMER CARBON-FIBER COMPOSITES AS REVEALED BY PHOTODEFLECTION METHODS
Authors: BERTOLOTTI M FERRARI A LIAKHOU GL LIVOTI R MARRAS A EZQUERRA TA BALTACALLEJA FJ
Citation: M. Bertolotti et al., THERMAL ANISOTROPY OF POLYMER CARBON-FIBER COMPOSITES AS REVEALED BY PHOTODEFLECTION METHODS, Journal of applied physics, 78(9), 1995, pp. 5706-5712
A PHOTOTERMAL EXPERIMENT INTERPRETED AS EVIDENCE OF ELECTRON-HOLE SELF-ORDERING IN AS-S CHALCOGENIDE GLASSES
Authors: ANTONYUK BP BERTOLOTTI M KISELEV SA LIAKHOU GL POPESCU AA SIBILIA C
Citation: Bp. Antonyuk et al., A PHOTOTERMAL EXPERIMENT INTERPRETED AS EVIDENCE OF ELECTRON-HOLE SELF-ORDERING IN AS-S CHALCOGENIDE GLASSES, Applied physics. B, Lasers and optics, 59(6), 1994, pp. 639-643
MEASUREMENTS OF THERMAL-CONDUCTIVITY OF DIAMOND FILMS BY PHOTOTHERMALDEFLECTION TECHNIQUE
Authors: BERTOLOTTI M LIAKHOU GL FERRARI A RALCHENKO VGF SMOLIN AA OBRAZTSOVA E KOROTOUSHENKO KG PIMENOV SM KONOV VI
Citation: M. Bertolotti et al., MEASUREMENTS OF THERMAL-CONDUCTIVITY OF DIAMOND FILMS BY PHOTOTHERMALDEFLECTION TECHNIQUE, Journal of applied physics, 75(12), 1994, pp. 7795-7798
NEW METHOD FOR THE STUDY OF MIRROR HEATING OF A SEMICONDUCTOR-LASER DIODE AND FOR THE DETERMINATION OF THERMAL-DIFFUSIVITY OF THE ENTIRE STRUCTURE
Authors: BERTOLOTTI M LIAKHOU GL VOTI RL SIBILIA C SYRBU A WANG RP
Citation: M. Bertolotti et al., NEW METHOD FOR THE STUDY OF MIRROR HEATING OF A SEMICONDUCTOR-LASER DIODE AND FOR THE DETERMINATION OF THERMAL-DIFFUSIVITY OF THE ENTIRE STRUCTURE, Applied physics letters, 65(18), 1994, pp. 2266-2268
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