ACNP - Italian Periodicals Catalogue

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Results: 1-25 | 26-37 |

Results: 26-37/37

CORRELATION BETWEEN INITIAL GROWTH PLANARITY AND EPILAYER TILTING IN THE VICINAL GAAS SI SYSTEM/

Authors: RIESZ F VARRIO J PESEK A LISCHKA K

Citation: F. Riesz et al., CORRELATION BETWEEN INITIAL GROWTH PLANARITY AND EPILAYER TILTING IN THE VICINAL GAAS SI SYSTEM/, Applied surface science, 75, 1994, pp. 248-251

EPITAXIAL OVERGROWTH OF II-VI COMPOUNDS ON PATTERNED SUBSTRATES

Authors: SCHIKORA D HAUSLEITNER H EINFELDT S BECKER CR WIDMER T GIFTGE C LUBKE K LISCHKA K VONORTENBERG M LANDWEHR G

Citation: D. Schikora et al., EPITAXIAL OVERGROWTH OF II-VI COMPOUNDS ON PATTERNED SUBSTRATES, Journal of crystal growth, 138(1-4), 1994, pp. 8-13

STRUCTURAL-PROPERTIES OF PERFECT ZNTE EPILAYERS ON (001) GAAS SUBSTRATES

Authors: LANG M SCHIKORA D WIDMER T GIFTGE C FORSTNER A HOLY V HUMENBERGER J LISCHKA K BRUNTHALER G SITTER H VONORTENBERG M

Citation: M. Lang et al., STRUCTURAL-PROPERTIES OF PERFECT ZNTE EPILAYERS ON (001) GAAS SUBSTRATES, Journal of crystal growth, 138(1-4), 1994, pp. 81-85

DEEP BLUE AND UV PHOTOLUMINESCENCE FROM ZNS CDS SUPERLATTICES AND QUANTUM-WELLS/

Authors: BRUNTHALER G LANG M FORSTNER A GIFTGE C SCHIKORA D FERREIRA S SITTER H LISCHKA K

Citation: G. Brunthaler et al., DEEP BLUE AND UV PHOTOLUMINESCENCE FROM ZNS CDS SUPERLATTICES AND QUANTUM-WELLS/, Journal of crystal growth, 138(1-4), 1994, pp. 559-563

ULTRAFAST DIFFUSION OF HG IN HG1-XCDXTE (X-APPROXIMATE-TO-0.21)

Authors: BELAS E HOSCHL P GRILL R FRANC J MORAVEC P LISCHKA K SITTER H TOTH A

Citation: E. Belas et al., ULTRAFAST DIFFUSION OF HG IN HG1-XCDXTE (X-APPROXIMATE-TO-0.21), Journal of crystal growth, 138(1-4), 1994, pp. 940-943

DEEP P-N-JUNCTION IN HG1-XCDXTE CREATED BY ION MILLING

Authors: BELAS E HOSCHL P GRILL R FRANC J MORAVEC P LISCHKA K SITTER H TOTH A

Citation: E. Belas et al., DEEP P-N-JUNCTION IN HG1-XCDXTE CREATED BY ION MILLING, Semiconductor science and technology, 8(9), 1993, pp. 1695-1699

DISTRIBUTION OF STRAIN IN GE ION-IMPLANTED SILICON MEASURED BY HIGH-RESOLUTION X-RAY-DIFFRACTION

Authors: PESEK A KASTLER P LISCHKA K PALMETSHOFER L

Citation: A. Pesek et al., DISTRIBUTION OF STRAIN IN GE ION-IMPLANTED SILICON MEASURED BY HIGH-RESOLUTION X-RAY-DIFFRACTION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 569-572

X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS

Authors: HOLY V KUBENA J OHLIDAL I LISCHKA K PLOTZ W

Citation: V. Holy et al., X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS, Physical review. B, Condensed matter, 47(23), 1993, pp. 15896-15903

SIMULATION OF X-RAY-DIFFRACTION CURVES FROM ION-IMPLANTED WAFERS AND RELAXED II-VI SUPERLATTICES

Authors: PESEK A KASTLER P PALMETSHOFER L HAUZENBERGER F JUZA P FASCHINGER W LISCHKA K

Citation: A. Pesek et al., SIMULATION OF X-RAY-DIFFRACTION CURVES FROM ION-IMPLANTED WAFERS AND RELAXED II-VI SUPERLATTICES, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 177-180

X-RAY DOUBLE AND TRIPLE-CRYSTAL DIFFRACTOMETRY OF MOSAIC STRUCTURE INHETEROEPITAXIAL LAYERS

Authors: HOLY V KUBENA J ABRAMOF E LISCHKA K PESEK A KOPPENSTEINER E

Citation: V. Holy et al., X-RAY DOUBLE AND TRIPLE-CRYSTAL DIFFRACTOMETRY OF MOSAIC STRUCTURE INHETEROEPITAXIAL LAYERS, Journal of applied physics, 74(3), 1993, pp. 1736-1743

P-TYPE CDTE EPILAYERS GROWN BY HOT-WALL-BEAM EPITAXY

Authors: PAULI H HINGERL K ABRAMOF E SITTER H ZAJICEK H LISCHKA K

Citation: H. Pauli et al., P-TYPE CDTE EPILAYERS GROWN BY HOT-WALL-BEAM EPITAXY, Journal of applied physics, 73(8), 1993, pp. 4061-4063

LATTICE MISFIT AND RELATIVE TILT OF LATTICE PLANES IN SEMICONDUCTOR HETEROSTRUCTURES

Authors: PESEK A HINGERL K RIESZ F LISCHKA K

Citation: A. Pesek et al., LATTICE MISFIT AND RELATIVE TILT OF LATTICE PLANES IN SEMICONDUCTOR HETEROSTRUCTURES, Semiconductor science and technology, 6(7), 1991, pp. 705-708

Risultati: 1-25 | 26-37 |