Citation: Da. Luh et al., 3-DIMENSIONAL ATOMIC IMAGES OF AS SI(111) OBTAINED BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY/, Physical review letters, 81(19), 1998, pp. 4160-4163
Citation: Mt. Sieger et al., PHOTOEMISSION EXTENDED FINE-STRUCTURE STUDY OF THE SIO2 SI(111) INTERFACE/, Physical review letters, 77(13), 1996, pp. 2758-2761