Authors:
Lebert, R
Aschke, L
Bergmann, K
Dusterer, S
Gabel, K
Hoffmann, D
Loosen, P
Neff, W
Nickles, P
Rosier, O
Poprawe, R
Rudolph, D
Sandner, W
Sauerbrey, R
Schmahl, G
Schwoerer, H
Stiehl, H
Will, I
Ziener, C
Citation: R. Lebert et al., Preliminary results from key experiments on sources for EUV lithography, MICROEL ENG, 57-8, 2001, pp. 87-92
Authors:
Bergmann, K
Muller, M
Reichartz, D
Neff, W
Lebert, R
Citation: K. Bergmann et al., Electrode phenomena and lifetime considerations in a radial multichannel pseudospark switch, IEEE PLAS S, 28(5), 2000, pp. 1486-1490
Citation: K. Bergmann et al., Pinch-plasma radiation source for extreme-ultraviolet lithography with a kilohertz repetition frequency, APPL OPTICS, 39(22), 2000, pp. 3833-3837
Citation: G. Schriever et al., Extreme ultraviolet emission of laser-produced plasmas using a cryogenic xenon target, J VAC SCI B, 17(5), 1999, pp. 2058-2060
Authors:
Lebert, R
Bergmann, K
Schriever, G
Neff, W
Citation: R. Lebert et al., Comparison of laser produced and gas discharge based EUV sources for different applications, MICROEL ENG, 46(1-4), 1999, pp. 465-468
Authors:
Bergmann, K
Schriever, G
Rosier, O
Muller, M
Neff, W
Lebert, R
Citation: K. Bergmann et al., Highly repetitive, extreme-ultraviolet radiation source based on a gas-discharge plasma, APPL OPTICS, 38(25), 1999, pp. 5413-5417
Authors:
Engel, A
Koshelev, KN
Sidelnikov, YV
Churilov, SS
Gavrilescu, C
Lebert, R
Citation: A. Engel et al., Population inversion due to charge-exchange interaction of plasma jets from plasma focus with residual gas, PHYS REV E, 58(6), 1998, pp. 7819-7822