Authors:
Zaitsev, AG
Schneider, R
Aidam, R
Linker, G
Ratzel, F
Reiner, J
Smithey, R
Geerk, J
Citation: Ag. Zaitsev et al., Effect of a Au contact layer on the microwave performance of YBa2Cu3O7-x thin films, IEEE APPL S, 11(1), 2001, pp. 3423-3426
Authors:
Geerk, J
Zaitsev, A
Linker, G
Aidam, R
Schneider, R
Ratzel, F
Fromknecht, R
Scheerer, B
Reiner, H
Gaganidze, E
Schwab, R
Citation: J. Geerk et al., A 3-chamber deposition system for the simultaneous double-sided coating of5-inch wafers, IEEE APPL S, 11(1), 2001, pp. 3856-3858
Authors:
Fromknecht, R
Linker, G
Khubeis, I
Wiss, T
Meyer, O
Citation: R. Fromknecht et al., Coherent precipitate formation and diffusion effects in Ge-implanted TiO2-single crystals, NUCL INST B, 178, 2001, pp. 97-100
Authors:
Geerk, J
Ratzel, F
Rietschel, H
Linker, G
Heidinger, R
Schwab, R
Citation: J. Geerk et al., Simultaneous double-sided deposition of HTS films on 3-inch wafers by ICM-sputtering, IEEE APPL S, 9(2), 1999, pp. 1543-1546
Authors:
Huang, MQ
Geerk, J
Massing, S
Meyer, O
Reiner, H
Linker, G
Citation: Mq. Huang et al., Textured CeO2 buffer layers on amorphous substrates by ion beam assisted deposition, NUCL INST B, 148(1-4), 1999, pp. 793-797