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Authors: Logothetidis, S Gioti, M Charitidis, C Patsalas, P
Citation: S. Logothetidis et al., Development of diamond and diamond-related materials with desired properties, ADV ENG MAT, 3(3), 2001, pp. 166-170

Authors: Patsalas, P Handrea, M Logothetidis, S Gioti, M Kennou, S Kautek, W
Citation: P. Patsalas et al., A complementary study of bonding and electronic structure of amorphous carbon films by electron spectroscopy and optical techniques, DIAM RELAT, 10(3-7), 2001, pp. 960-964

Authors: Laskarakis, A Logothetidis, S Charitidis, C Gioti, M Panayiotatos, Y Handrea, M Kautek, W
Citation: A. Laskarakis et al., A study on the bonding structure and mechanical properties of magnetron sputtered CNx thin films, DIAM RELAT, 10(3-7), 2001, pp. 1179-1184

Authors: Logothetidis, S Gioti, M Patsalas, P
Citation: S. Logothetidis et al., Real-time monitoring, growth kinetics and properties of carbon based materials deposited by sputtering, DIAM RELAT, 10(2), 2001, pp. 117-124

Authors: Hastas, NA Dimitriadis, CA Logothetidis, S Angelis, CT Konofaos, N Evangelou, EK
Citation: Na. Hastas et al., Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface, SEMIC SCI T, 16(6), 2001, pp. 474-477

Authors: Patsalas, P Logothetidis, S
Citation: P. Patsalas et S. Logothetidis, Crystallization effects and diamond formation in amorphous carbon films under low energy ion beam irradiation, NUCL INST B, 178, 2001, pp. 247-251

Authors: Laskarakis, A Logothetidis, S Gioti, M
Citation: A. Laskarakis et al., Bonding structure of carbon nitride films by infrared ellipsometry - art. no. 125419, PHYS REV B, 6412(12), 2001, pp. 5419

Authors: Patsalas, P Logothetidis, S
Citation: P. Patsalas et S. Logothetidis, Optical, electronic, and transport properties of nanocrystalline titanium nitride thin films, J APPL PHYS, 90(9), 2001, pp. 4725-4734

Authors: Hastas, NA Dimitriadis, CA Patsalas, P Panayiotatos, Y Tassis, DH Logothetidis, S
Citation: Na. Hastas et al., Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions, J APPL PHYS, 89(5), 2001, pp. 2832-2838

Authors: Dimitriadis, CA Hastas, NA Vouroutzis, N Logothetidis, S Panayiotatos, Y
Citation: Ca. Dimitriadis et al., Microstructure and its effect on the conductivity of magnetron sputtered carbon thin films, J APPL PHYS, 89(12), 2001, pp. 7954-7959

Authors: Hastas, NA Dimitriadis, CA Tassis, DH Logothetidis, S
Citation: Na. Hastas et al., Electrical characterization of nanocrystalline carbon-silicon heterojunctions, APPL PHYS L, 79(5), 2001, pp. 638-640

Authors: Hastas, NA Dimitriadis, CA Tassis, DH Panayiotatos, Y Logothetidis, S Papadimitriou, D
Citation: Na. Hastas et al., Electrical properties of magnetron sputtered amorphous carbon films with sequential sp(3)-rich/sp(2)-rich layered structure, APPL PHYS L, 79(20), 2001, pp. 3269-3271

Authors: Konofaos, N Angelis, CT Evangelou, EK Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Charge carrier response time in sputtered a-C/n-Si heterojunctions, APPL PHYS L, 79(15), 2001, pp. 2381-2383

Authors: Konofaos, N Angelis, CT Evangelou, EK Panayiotatos, Y Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Electrical characterization of TiN/a-C/Si devices grown by magnetron sputtering at room temperature, APPL PHYS L, 78(12), 2001, pp. 1682-1684

Authors: Komninou, P Nouet, G Patsalas, P Kehagias, T Gioti, M Logothetidis, S Karakostas, T
Citation: P. Komninou et al., Crystalline structures of carbon complexes in amorphous carbon films, DIAM RELAT, 9(3-6), 2000, pp. 703-706

Authors: Gioti, M Papadimitriou, D Logothetidis, S
Citation: M. Gioti et al., Optical properties and new vibrational modes in carbon films, DIAM RELAT, 9(3-6), 2000, pp. 741-745

Authors: Logothetidis, S Charitidis, C Gioti, M Panayiotatos, Y Handrea, M Kautek, W
Citation: S. Logothetidis et al., Comprehensive study on the properties of multilayered amorphous carbon films, DIAM RELAT, 9(3-6), 2000, pp. 756-760

Authors: Evangelou, E Konofaos, N Gioti, M Logothetidis, S
Citation: E. Evangelou et al., Nitrogen induced states at the CNx/Si interface, MAT SCI E B, 71, 2000, pp. 315-320

Authors: Charitidis, C Logothetidis, S Gioti, M
Citation: C. Charitidis et al., A comparative study of the nanoscratching behavior of amorphous carbon films grown under various deposition conditions, SURF COAT, 125(1-3), 2000, pp. 201-206

Authors: Gioti, M Logothetidis, S Patsalas, P Laskarakis, A Panayiotatos, Y Kechagias, V
Citation: M. Gioti et al., Magnetron sputtered carbon nitride: composition and chemical bonding of as-grown and post-annealed films studied with real-time and in situ diagnostic techniques, SURF COAT, 125(1-3), 2000, pp. 289-294

Authors: Patsalas, P Charitidis, C Logothetidis, S
Citation: P. Patsalas et al., The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films, SURF COAT, 125(1-3), 2000, pp. 335-340

Authors: Logothetidis, S
Citation: S. Logothetidis, Sputtered amorphous carbon films: Micro-structure, density, optical and mechanical properties, INT J MOD B, 14(2-3), 2000, pp. 113-124

Authors: Patsalas, P Charitidis, C Logothetidis, S
Citation: P. Patsalas et al., In situ and real-time ellipsometry monitoring of submicron titanium nitride/titanium silicide electronic devices, APPL SURF S, 154, 2000, pp. 256-262

Authors: Logothetidis, S Patsalas, P Gioti, M Galdikas, A Pranevicius, L
Citation: S. Logothetidis et al., Growth kinetics of sputtered amorphous carbon thin films: composition studies and phenomenological model, THIN SOL FI, 376(1-2), 2000, pp. 56-66

Authors: Kechagias, VG Gioti, M Logothetidis, S Benferhat, R Teer, D
Citation: Vg. Kechagias et al., 'Real-time' multiwavelength ellipsometry diagnostics for monitoring dry etching of Si and TiNx deposition, THIN SOL FI, 364(1-2), 2000, pp. 213-219
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