AAAAAA

   
Results: 1-15 |
Results: 15
Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography
Authors: Zeimer, U Grenzer, J Baumbach, T Lubbert, D Mazuelas, A Erbert, G
Citation: U. Zeimer et al., Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography, MAT SCI E B, 80(1-3), 2001, pp. 87-90
Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices
Authors: Giannini, C Baumbach, T Lubbert, D Felici, R Tapfer, L Marschner, T Stolz, W Jin-Phillipp, NY Phillipp, F
Citation: C. Giannini et al., Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices, PHYS REV B, 61(3), 2000, pp. 2173-2179
Strain relaxation in surface nano-structures studied by X-ray diffraction methods
Authors: Baumbach, T Lubbert, D Gailhanou, M
Citation: T. Baumbach et al., Strain relaxation in surface nano-structures studied by X-ray diffraction methods, MAT SCI E B, 69, 2000, pp. 392-396
Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
Authors: Buttard, D Eymery, J Rieutord, F Fournel, F Lubbert, D Baumbach, T Moriceau, H
Citation: D. Buttard et al., Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces, PHYSICA B, 283(1-3), 2000, pp. 103-107
mu m-resolved high resolution X-ray diffraction imaging for semiconductor quality control
Authors: Lubbert, D Baumbach, T Hartwig, J Boller, E Pernot, E
Citation: D. Lubbert et al., mu m-resolved high resolution X-ray diffraction imaging for semiconductor quality control, NUCL INST B, 160(4), 2000, pp. 521-527
Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction
Authors: Baumbach, T Lubbert, D Gailhanou, M
Citation: T. Baumbach et al., Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction, J APPL PHYS, 87(8), 2000, pp. 3744-3758
Strain relaxation in surface nano-structures studied by X-ray diffraction methods
Authors: Baumbach, T Lubbert, D Gailhanou, M
Citation: T. Baumbach et al., Strain relaxation in surface nano-structures studied by X-ray diffraction methods, JPN J A P 1, 38(12A), 1999, pp. 6591-6596
Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory
Authors: Lubbert, D Baumbach, T Ponti, S Pietsch, U Leprince, L Schneck, J Talneau, A
Citation: D. Lubbert et al., Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory, EUROPH LETT, 46(4), 1999, pp. 479-485
Grazing incidence diffraction by laterally patterned semiconductor nanostructures
Authors: Baumbach, T Lubbert, D
Citation: T. Baumbach et D. Lubbert, Grazing incidence diffraction by laterally patterned semiconductor nanostructures, J PHYS D, 32(6), 1999, pp. 726-740
Elastic stress relaxation in GaInAsP quantum wires on InP
Authors: Lubbert, D Jenichen, B Baumbach, T Grahn, HT Paris, G Mazuelas, A Kojima, T Arai, S
Citation: D. Lubbert et al., Elastic stress relaxation in GaInAsP quantum wires on InP, J PHYS D, 32(10A), 1999, pp. A21-A25
In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation
Authors: Zeimer, U Baumbach, T Grenzer, J Lubbert, D Mazuelas, A Pietsch, U Erbert, G
Citation: U. Zeimer et al., In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation, J PHYS D, 32(10A), 1999, pp. A123-A127
X-ray structure investigation of lateral surface nanostructures - a full quantitative analysis of non-uniform lattice strain
Authors: Baumbach, GT Lubbert, D Gailhanou, M
Citation: Gt. Baumbach et al., X-ray structure investigation of lateral surface nanostructures - a full quantitative analysis of non-uniform lattice strain, J PHYS D, 32(10A), 1999, pp. A208-A211
Investigation of strain induced patterning in superlattices by grazing incidence diffraction - comparison of morphological and strain ordering
Authors: Baumbach, GT Giannini, C Lubbert, D Felici, R Tapfer, L Marschner, T Stolz, W
Citation: Gt. Baumbach et al., Investigation of strain induced patterning in superlattices by grazing incidence diffraction - comparison of morphological and strain ordering, J PHYS D, 32(10A), 1999, pp. A212-A215
Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction
Authors: Zhuang, Y Holy, V Stangl, J Darhuber, AA Mikulik, P Zerlauth, S Schaffler, F Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: Y. Zhuang et al., Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction, J PHYS D, 32(10A), 1999, pp. A224-A229
Lateral arrangement of self-assembled quantum dots in an SiGe Si superlattice
Authors: Holy, V Stangl, J Zerlauth, S Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: V. Holy et al., Lateral arrangement of self-assembled quantum dots in an SiGe Si superlattice, J PHYS D, 32(10A), 1999, pp. A234-A238
Risultati: 1-15 |