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Results:
1-9
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Results: 9
Authors:
Ludeke, R
Cartier, E
Citation: R. Ludeke et E. Cartier, Imaging of oxide and interface charges in SiO2-Si, MICROEL ENG, 59(1-4), 2001, pp. 259-263
Authors:
Ludeke, R
Cartier, E
Citation: R. Ludeke et E. Cartier, Imaging of trapped charge in SiO2 and at the SiO2-Si interface, APPL PHYS L, 78(25), 2001, pp. 3998-4000
Authors:
Ludeke, R
Cuberes, MT
Cartier, E
Citation: R. Ludeke et al., Hot carrier transport effects in Al2O3-based metal-oxide-semiconductor structures, J VAC SCI B, 18(4), 2000, pp. 2153-2159
Authors:
Ludeke, R
Citation: R. Ludeke, Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy, IBM J RES, 44(4), 2000, pp. 517-534
Authors:
Urchueguia, C
Ludeke, R
Citation: C. Urchueguia et R. Ludeke, Der 'Doppelganger' - Towards a functional-historical description of Schubert's Heine settings (Lieder, music, Romantic movement), DEUT VIER L, 74(2), 2000, pp. 279-304
Authors:
Ludeke, R
Cuberes, MT
Cartier, E
Citation: R. Ludeke et al., Local transport and trapping issues in Al2O3 gate oxide structures, APPL PHYS L, 76(20), 2000, pp. 2886-2888
Authors:
Ludeke, R
Schenk, A
Citation: R. Ludeke et A. Schenk, Energy-dependent conduction band mass of SiO2 determined by ballistic electron emission microscopy, J VAC SCI B, 17(4), 1999, pp. 1823-1830
Authors:
Ludeke, R
Cartier, E
Schenk, A
Citation: R. Ludeke et al., Determination of the energy-dependent conduction band mass in SiO2, APPL PHYS L, 75(10), 1999, pp. 1407-1409
Authors:
Ludeke, R
Wen, HJ
Schenk, A
Citation: R. Ludeke et al., Quantum interference in SiO2: A conduction-band mass reappraisal, APPL PHYS L, 73(9), 1998, pp. 1221-1223
Risultati:
1-9
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