Authors:
Cho, MH
Ko, DH
Choi, YG
Jeong, K
Lyo, IW
Noh, DY
Kim, HJ
Whang, CN
Citation: Mh. Cho et al., Structural and electrical characteristics of Y2O3 films grown on oxidized Si(100) surface, J VAC SCI A, 19(1), 2001, pp. 192-199
Citation: Sw. Whangbo et al., Effect of oxidized Al prelayer for the growth of poly-crystalline Al2O3 films on Si using ionized beam deposition, THIN SOL FI, 388(1-2), 2001, pp. 290-294
Authors:
Cho, MH
Ko, DH
Seo, JG
Whangbo, SW
Jeong, K
Lyo, IW
Whang, CN
Noh, DY
Kim, HJ
Citation: Mh. Cho et al., Characteristics of Y2O3 films on Si(111) grown by oxygen-ion beam-assisteddeposition, THIN SOL FI, 382(1-2), 2001, pp. 288-296
Authors:
Cho, WS
Kim, JY
Kim, SS
Choi, DS
Jeong, K
Lyo, IW
Whang, CN
Chae, KH
Citation: Ws. Cho et al., Atomic structure of Ba layer on Si(001)-(2 x 1) surface studied by low energy ion scattering, SURF SCI, 476(3), 2001, pp. L259-L266
Authors:
Jang, HK
Whangbo, SW
Chung, YD
Kim, TG
Kim, HB
Lyo, IW
Whang, CN
Wang, CH
Choi, DJ
Kim, TK
Lee, HS
Citation: Hk. Jang et al., Comparison of titanium oxide films grown on bare glass and boiled glass in50% H2SO4 by metal-organic chemical vapor deposition, J VAC SCI A, 18(5), 2000, pp. 2394-2399
Citation: My. Jung et al., Fabrication of a nanosize metal aperture for a near field scanning opticalmicroscopy sensor using photoresist removal and sputtering techniques, J VAC SCI A, 18(4), 2000, pp. 1333-1337
Authors:
Jang, HK
Whangbo, SW
Kim, HB
Im, KY
Lee, YS
Lyo, IW
Whang, CN
Kim, G
Lee, HS
Lee, JM
Citation: Hk. Jang et al., Titanium oxide films on Si(100) deposited by electron-beam evaporation at 250 degrees C, J VAC SCI A, 18(3), 2000, pp. 917-921
Citation: Hs. Ahn et al., Influence of molybdenum composition in chromium oxide-based coatings on their tribological behavior, SURF COAT, 133, 2000, pp. 351-361
Citation: Mh. Cho et al., Temperature dependence of the properties of heteroepitaxial Y2O3 films grown on Si by ion assisted evaporation, J APPL PHYS, 86(1), 1999, pp. 198-204