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Results: 1-7 |
Results: 7

Authors: MASSENGILL LW
Citation: Lw. Massengill, 1997 SPECIAL NSREC ISSUE OF THE IEEE-TRANSACTIONS-ON-NUCLEAR-SCIENCE - GUEST EDITORS COMMENTS, IEEE transactions on nuclear science, 44(6), 1997, pp. 1786-1786

Authors: MASSENGILL LW
Citation: Lw. Massengill, COSMIC AND TERRESTRIAL SINGLE-EVENT RADIATION EFFECTS IN DYNAMIC RANDOM-ACCESS MEMORIES, IEEE transactions on nuclear science, 43(2), 1996, pp. 576-593

Authors: GULATI K MASSENGILL LW AGRAWAL GR
Citation: K. Gulati et al., SINGLE EVENT MIRRORING AND DRAM SENSE AMPLIFIER DESIGNS FOR IMPROVED SINGLE-EVENT-UPSET PERFORMANCE, IEEE transactions on nuclear science, 41(6), 1994, pp. 2026-2034

Authors: AGRAWAL GR MASSENGILL LW GULATI K
Citation: Gr. Agrawal et al., A PROPOSED SEU TOLERANT DYNAMIC RANDOM-ACCESS MEMORY (DRAM) CELL, IEEE transactions on nuclear science, 41(6), 1994, pp. 2035-2042

Authors: VELACHERI S MASSENGILL LW KERNS SE
Citation: S. Velacheri et al., SINGLE-EVENT-INDUCED CHARGE COLLECTION AND DIRECT CHANNEL CONDUCTION IN SUBMICRON MOSFETS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2103-2111

Authors: MILANOWSKI RJ PAGEY MP MATTA AI BHUVA BL MASSENGILL LW KERNS SE
Citation: Rj. Milanowski et al., COMBINED EFFECT OF X-IRRADIATION AND FORMING GAS ANNEAL ON THE HOT-CARRIER RESPONSE OF MOS OXIDES, IEEE transactions on nuclear science, 40(6), 1993, pp. 1360-1366

Authors: MASSENGILL LW ALLES ML KERNS SE JONES KL
Citation: Lw. Massengill et al., EFFECTS OF PROCESS PARAMETER DISTRIBUTIONS AND ION STRIKE LOCATIONS ON SEU CROSS-SECTION DATA, IEEE transactions on nuclear science, 40(6), 1993, pp. 1804-1811
Risultati: 1-7 |