Authors: NIXON MA MCCALLUM BC FRIGHT WR PRICE NB

Citation: Ma. Nixon et al., THE EFFECTS OF METALS AND INTERFERING FIELDS AND ON ELECTROMAGNETIC TRACKERS, Presence, 7(2), 1998, pp. 204-218

Authors: MCCALLUM BC LANDAUER MN RODENBURG JM

Citation: Bc. Mccallum et al., COMPLEX IMAGE-RECONSTRUCTION OF WEAK SPECIMENS FROM A 3-SECTOR DETECTOR IN THE STEM (VOL 101, PG 53, 1995), Optik, 103(3), 1996, pp. 131-132

Authors: MCCALLUM BC LANDAUER MN RODENBURG JM

Citation: Bc. Mccallum et al., COMPLEX IMAGE-RECONSTRUCTION OF WEAK SPECIMENS FROM A 3-SECTOR DETECTOR IN THE STEM, Optik, 101(2), 1995, pp. 53-62

Authors: LANDAUER MN MCCALLUM BC RODENBURG JM

Citation: Mn. Landauer et al., DOUBLE RESOLUTION IMAGING OF WEAK PHASE SPECIMENS WITH QUADRANT DETECTORS IN THE STEM, Optik, 100(1), 1995, pp. 37-46

Authors: NELLIST PD MCCALLUM BC RODENBURG JM

Citation: Pd. Nellist et al., RESOLUTION BEYOND THE INFORMATION LIMIT IN TRANSMISSION ELECTRON-MICROSCOPY, Nature, 374(6523), 1995, pp. 630-632

Authors: MCCALLUM BC RODENBURG JM

Citation: Bc. Mccallum et Jm. Rodenburg, ERROR ANALYSIS OF CRYSTALLINE PTYCHOGRAPHY IN THE STEM MODE, Ultramicroscopy, 52(1), 1993, pp. 85-99