Authors: AYRES JR BROTHERTON SD MCCULLOCH DJ TRAINOR MJ

Citation: Jr. Ayres et al., ANALYSIS OF DRAIN FIELD AND HOT-CARRIER STABILITY OF POLY-SI THIN-FILM TRANSISTORS, JPN J A P 1, 37(4A), 1998, pp. 1801-1808

Authors: YOUNG ND HARKIN G BUNN RM MCCULLOCH DJ WILKS RW KNAPP AG

Citation: Nd. Young et al., NOVEL FINGERPRINT SCANNING ARRAYS USING POLYSILICON TFTS ON GLASS ANDPOLYMER SUBSTRATES, IEEE electron device letters, 18(1), 1997, pp. 19-20

Authors: BROTHERTON SD MCCULLOCH DJ GOWERS JP AYRES JR TRAINOR MJ

Citation: Sd. Brotherton et al., INFLUENCE OF MELT DEPTH IN LASER CRYSTALLIZED POLY-SI THIN-FILM TRANSISTORS, Journal of applied physics, 82(8), 1997, pp. 4086-4094

Authors: YOUNG ND HARKIN G BUNN RM MCCULLOCH DJ FRENCH DJ

Citation: Nd. Young et al., THE FABRICATION AND CHARACTERIZATION OF EEPROM ARRAYS ON GLASS USING A LOW-TEMPERATURE POLY-SI TFT PROCESS, I.E.E.E. transactions on electron devices, 43(11), 1996, pp. 1930-1936

Authors: MCCULLOCH DJ BROTHERTON SD

Citation: Dj. Mcculloch et Sd. Brotherton, SURFACE-ROUGHNESS EFFECTS IN LASER CRYSTALLIZED POLYCRYSTALLINE SILICON, Applied physics letters, 66(16), 1995, pp. 2060-2062