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Results:
1-14
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Results: 14
Authors:
HERZINGER CM
JOHS B
MCGAHAN WA
PAULSON W
Citation: Cm. Herzinger et al., A MULTISAMPLE, MULTIWAVELENGTH, MULTI-ANGLE INVESTIGATION OF THE INTERFACE LAYER BETWEEN SILICON AND THERMALLY GROWN SILICON DIOXIDE, Thin solid films, 313, 1998, pp. 281-285
Authors:
HERZINGER CM
JOHS B
MCGAHAN WA
WOOLLAM JA
PAULSON W
Citation: Cm. Herzinger et al., ELLIPSOMETRIC DETERMINATION OF OPTICAL-CONSTANTS FOR SILICON AND THERMALLY GROWN SILICON DIOXIDE VIA A MULTISAMPLE, MULTIWAVELENGTH, MULTI-ANGLE INVESTIGATION, Journal of applied physics, 83(6), 1998, pp. 3323-3336
Authors:
SCHAFFER WJ
SCHEY D
BOWMAN ML
MCGAHAN WA
BOISEN JK
STRAUSSER YE
BRAN ME
Citation: Wj. Schaffer et al., 300-MM PREMETAL DIELECTRIC PROCESSING, Solid state technology, 40(9), 1997, pp. 117
Authors:
MASUMOTO K
MCGAHAN WA
Citation: K. Masumoto et Wa. Mcgahan, ELECTROMAGNETIC APPLICATIONS OF INTERMETALLIC COMPOUNDS, MRS bulletin, 21(5), 1996, pp. 44-49
Authors:
SYNOWICKI RA
HALE JS
MCGAHAN WA
IANNO NJ
WOOLLAM JA
Citation: Ra. Synowicki et al., OXYGEN PLASMA ASHER CONTAMINATION - AN ANALYSIS OF SOURCES AND REMEDIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(6), 1996, pp. 3075-3081
Authors:
ATHEY PR
URBAN FK
TABET MF
MCGAHAN WA
Citation: Pr. Athey et al., OPTICAL-PROPERTIES OF COBALT OXIDE-FILMS DEPOSITED BY SPRAY-PYROLYSIS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 685-692
Authors:
JOHS BD
MCGAHAN WA
WOOLLAM JA
Citation: Bd. Johs et al., OPTICAL ANALYSIS OF COMPLEX MULTILAYER STRUCTURES USING MULTIPLE DATA-TYPES, Thin solid films, 253(1-2), 1994, pp. 25-27
Authors:
MCGAHAN WA
MAKOVICKA T
HALE J
WOOLLAM JA
Citation: Wa. Mcgahan et al., MODIFIED FOROUHI AND BLOOMER DISPERSION MODEL FOR THE OPTICAL-CONSTANTS OF AMORPHOUS HYDROGENATED CARBON THIN-FILMS, Thin solid films, 253(1-2), 1994, pp. 57-61
Authors:
WOOLLAM JA
MCGAHAN WA
JOHS B
Citation: Ja. Woollam et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF INDIUM TIN OXIDE AND OTHER FLAT-PANEL DISPLAY MULTILAYER MATERIALS, Thin solid films, 241(1-2), 1994, pp. 44-46
Authors:
MCGAHAN WA
MAKOVICKA T
HALE J
WOOLLAM JA
Citation: Wa. Mcgahan et al., CARBON OVERCOATS WITH CONTROLLED PROPERTIES - NONDESTRUCTIVE ELLIPSOMETRY EVALUATION, Surface & coatings technology, 62(1-3), 1993, pp. 707-710
Authors:
MCGAHAN WA
JOHS B
WOOLLAM JA
Citation: Wa. Mcgahan et al., TECHNIQUES FOR ELLIPSOMETRIC MEASUREMENT OF THE THICKNESS AND OPTICAL-CONSTANTS OF THIN ABSORBING FILMS, Thin solid films, 234(1-2), 1993, pp. 443-446
Authors:
ORLOFF GJ
WOOLLAM JA
HE P
MCGAHAN WA
MCNEIL JR
JACOBSON RD
JOHS B
Citation: Gj. Orloff et al., EX-SITU VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY STUDIES OF ELECTRON-CYCLOTRON-RESONANCE ETCHING OF HG1-XCDXTE, Thin solid films, 233(1-2), 1993, pp. 46-49
Authors:
NAFIS S
IANNO NJ
SYNDER PG
MCGAHAN WA
JOHS B
WOOLLAM JA
Citation: S. Nafis et al., ELECTRON-CYCLOTRON-RESONANCE ETCHING OF SEMICONDUCTOR STRUCTURES STUDIED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 253-255
Authors:
COLE KD
MCGAHAN WA
Citation: Kd. Cole et Wa. Mcgahan, THEORY OF MULTILAYERS HEATED BY LASER-ABSORPTION, Journal of heat transfer, 115(3), 1993, pp. 767-771
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