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Results: 1-21 |
Results: 21
SILICON FIELD EMITTER CATHODES - FABRICATION, PERFORMANCE, AND APPLICATIONS
Authors: TEMPLE D PALMER WD YADON LN MANCUSI JE VELLENGA D MCGUIRE GE
Citation: D. Temple et al., SILICON FIELD EMITTER CATHODES - FABRICATION, PERFORMANCE, AND APPLICATIONS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1980-1990
BRUNDLE,DICK - PUBLISHERS NOTE
Authors: HITCHCOCK AP MCGUIRE GE PIREAUX JJ
Citation: Ap. Hitchcock et al., BRUNDLE,DICK - PUBLISHERS NOTE, Journal of electron spectroscopy and related phenomena, 83(1), 1997, pp. 11-12
SURFACE CHARACTERIZATION
Authors: MCGUIRE GE WEISS PS KUSHMERICK JG JOHNSON JA SIMKO SJ NEMANICH RJ PARIKH NR CHOPRA DR
Citation: Ge. Mcguire et al., SURFACE CHARACTERIZATION, Analytical chemistry, 69(12), 1997, pp. 231-250
EMISSION MEASUREMENTS AND SIMULATION OF SILICON FIELD-EMITTER ARRAYS WITH LINEAR PLANAR LENSES
Authors: TANG CM SWYDEN TA THOMASON KA YADON LN TEMPLE D BALL CA PALMER WD MANCUSI JE VELLENGA D MCGUIRE GE
Citation: Cm. Tang et al., EMISSION MEASUREMENTS AND SIMULATION OF SILICON FIELD-EMITTER ARRAYS WITH LINEAR PLANAR LENSES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3455-3459
SURFACE AND COATINGS TECHNOLOGY - PAPERS PRESENTED AT THE 23RD INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 22-26, 1996 .1. PREFACE
Authors: SARTWELL BD MCGUIRE GE JEHN HA PETROV I
Citation: Bd. Sartwell et al., SURFACE AND COATINGS TECHNOLOGY - PAPERS PRESENTED AT THE 23RD INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 22-26, 1996 .1. PREFACE, Surface & coatings technology, 87-8(1-3), 1996, pp. 5-5
PAPERS PRESENTED AT THE 23RD INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 22-26, 1996 - PREFACE
Authors: SARTWELL BD MCGUIRE GE JEHN HA PETROV I
Citation: Bd. Sartwell et al., PAPERS PRESENTED AT THE 23RD INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 22-26, 1996 - PREFACE, Thin solid films, 291, 1996, pp. 11-11
STUDIES OF FILM GROWTH-PROCESSES AND SURFACE STRUCTURAL CHARACTERIZATION OF FERROELECTRIC MEMORY-COMPATIBLE SRBI2TA2O9 LAYERED PEROVSKITES VIA IN-SITU, REAL-TIME ION-BEAM ANALYSIS
Authors: AUCIELLO O KRAUSS AR IM J GRUEN DM IRENE EA CHANG RPH MCGUIRE GE
Citation: O. Auciello et al., STUDIES OF FILM GROWTH-PROCESSES AND SURFACE STRUCTURAL CHARACTERIZATION OF FERROELECTRIC MEMORY-COMPATIBLE SRBI2TA2O9 LAYERED PEROVSKITES VIA IN-SITU, REAL-TIME ION-BEAM ANALYSIS, Applied physics letters, 69(18), 1996, pp. 2671-2673
SILICON FIELD EMITTER ARRAYS WITH LOW CAPACITANCE AND IMPROVED TRANSCONDUCTANCE FOR MICROWAVE-AMPLIFIER APPLICATIONS
Authors: PALMER D GRAY HF MANCUSI J TEMPLE D BALL C SHAW JL MCGUIRE GE
Citation: D. Palmer et al., SILICON FIELD EMITTER ARRAYS WITH LOW CAPACITANCE AND IMPROVED TRANSCONDUCTANCE FOR MICROWAVE-AMPLIFIER APPLICATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 576-579
MINICOLUMN SILICON FIELD-EMITTER ARRAYS
Authors: YADON LN TEMPLE D PALMER WD BALL CA MCGUIRE GE TANG CM SWYDEN TA
Citation: Ln. Yadon et al., MINICOLUMN SILICON FIELD-EMITTER ARRAYS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 580-584
FABRICATION OF COLUMN-BASED SILICON FIELD EMITTER ARRAYS FOR ENHANCEDPERFORMANCE AND YIELD
Authors: TEMPLE D BALL CA PALMER WD YADON LN VELLENGA D MANCUSI J MCGUIRE GE GRAY HF
Citation: D. Temple et al., FABRICATION OF COLUMN-BASED SILICON FIELD EMITTER ARRAYS FOR ENHANCEDPERFORMANCE AND YIELD, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(1), 1995, pp. 150-157
22ND INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 24-28, 1995 .1. PREFACE
Authors: JEHN HA MATTHEWS A MCGUIRE GE PETROV I
Citation: Ha. Jehn et al., 22ND INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 24-28, 1995 .1. PREFACE, Surface & coatings technology, 76(1-3), 1995, pp. 5-5
PAPERS PRESENTED AT THE 22ND INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 24-28, 1995 - PREFACE
Authors: JEHN HA MATTHEWS A MCGUIRE GE PETROV I
Citation: Ha. Jehn et al., PAPERS PRESENTED AT THE 22ND INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 24-28, 1995 - PREFACE, Thin solid films, 270(1-2), 1995, pp. 13-13
LOW-VOLTAGE ELECTRON-EMISSION FROM PB(ZRXTI1-X)O-3-BASED THIN-FILM CATHODES
Authors: AUCIELLO O RAY MA PALMER D DUARTE J MCGUIRE GE TEMPLE D
Citation: O. Auciello et al., LOW-VOLTAGE ELECTRON-EMISSION FROM PB(ZRXTI1-X)O-3-BASED THIN-FILM CATHODES, Applied physics letters, 66(17), 1995, pp. 2183-2185
SURFACE CHARACTERIZATION
Authors: MCGUIRE GE SWANSON ML PARIKH NR SIMKO S WEISS PS FERRIS JH NEMANICH RJ CHOPRA DR CHOURASIA AR
Citation: Ge. Mcguire et al., SURFACE CHARACTERIZATION, Analytical chemistry, 67(12), 1995, pp. 199-220
ON THE SPATIAL-RESOLUTION OF 2-DIMENSIONAL DOPING PROFILES AS MEASURED USING SECONDARY-ION MASS-SPECTROMETRY TOMOGRAPHY
Authors: LIU X GOODWINJOHANSSON S JACOBSON JD RAY MA MCGUIRE GE
Citation: X. Liu et al., ON THE SPATIAL-RESOLUTION OF 2-DIMENSIONAL DOPING PROFILES AS MEASURED USING SECONDARY-ION MASS-SPECTROMETRY TOMOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(1), 1994, pp. 116-124
PAPERS PRESENTED AT THE 21ST INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 25-29, 1994 - PREFACE
Authors: SARTWELL BD MCGUIRE GE JEHN HA
Citation: Bd. Sartwell et al., PAPERS PRESENTED AT THE 21ST INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 25-29, 1994 - PREFACE, Surface & coatings technology, 68, 1994, pp. 180000005-180000005
HIGH-RESISTIVITY CO AND TI SILICIDE FORMATION ON SILICON-ON-INSULATORSUBSTRATES
Authors: HSIA SL MCGUIRE GE TAN TY SMITH PL LYNCH WT
Citation: Sl. Hsia et al., HIGH-RESISTIVITY CO AND TI SILICIDE FORMATION ON SILICON-ON-INSULATORSUBSTRATES, Thin solid films, 253(1-2), 1994, pp. 462-466
MEASURED DC PERFORMANCE OF LARGE ARRAYS OF SILICON FIELD EMITTERS
Authors: PALMER WD MANCUSI JE BALL CA JOINES WT MCGUIRE GE TEMPLE D VELLENGA DG YADON L
Citation: Wd. Palmer et al., MEASURED DC PERFORMANCE OF LARGE ARRAYS OF SILICON FIELD EMITTERS, I.E.E.E. transactions on electron devices, 41(10), 1994, pp. 1866-1870
PAPERS PRESENTED AT THE 20TH INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 19-23, 1993 .1. PREFACE
Authors: MCGUIRE GE MATTHEWS A JEHN HA
Citation: Ge. Mcguire et al., PAPERS PRESENTED AT THE 20TH INTERNATIONAL-CONFERENCE ON METALLURGICAL COATINGS AND THIN-FILMS, SAN-DIEGO, CA, USA, APRIL 19-23, 1993 .1. PREFACE, Surface & coatings technology, 61(1-3), 1993, pp. 180000005-180000005
SELECTIVE PLASMA DEPOSITION
Authors: RAY MA DUARTE J MCGUIRE GE
Citation: Ma. Ray et al., SELECTIVE PLASMA DEPOSITION, Thin solid films, 236(1-2), 1993, pp. 274-280
SURFACE CHARACTERIZATION
Authors: MCGUIRE GE RAY MA SIMKO SJ PERKINS FK BRANDOW SL DOBISZ EA NEMANICH RJ CHOURASIA AR CHOPRA DR
Citation: Ge. Mcguire et al., SURFACE CHARACTERIZATION, Analytical chemistry, 65(12), 1993, pp. 311-333
Risultati: 1-21 |