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Results:
1-13
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Results: 13
Authors:
HEISIG S
DANZEBRINK HU
LEYK A
MERTIN W
MUNSTER S
OESTERSCHULZE E
Citation: S. Heisig et al., MONOLITHIC GALLIUM-ARSENIDE CANTILEVER FOR SCANNING NEAR-FIELD MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 99-105
Authors:
BAE S
SCHLENSOG A
MERTIN W
KUBALEK E
MAYWALD M
Citation: S. Bae et al., A NEW TEST METHOD FOR CONTACTLESS QUANTITATIVE CURRENT MEASUREMENT VIA SCANNING MAGNETO-RESISTIVE PROBE MICROSCOPY, Microelectronics and reliability, 38(6-8), 1998, pp. 969-974
Authors:
WITTPAHL V
BEHNKE U
WAND B
MERTIN W
Citation: V. Wittpahl et al., CANTILEVER INFLUENCE SUPPRESSION OF CONTACTLESS IC-TESTING BY ELECTRIC FORCE MICROSCOPY, Microelectronics and reliability, 38(6-8), 1998, pp. 981-986
Authors:
MERTIN W
Citation: W. Mertin, ELECTRON CRYSTALLOGRAPHY - NOW A HANDY METHOD, Angewandte Chemie, International Edition in English, 36(1-2), 1997, pp. 46-47
Authors:
BANGERT J
KASIM S
MERTIN W
KUBALEK E
Citation: J. Bangert et al., A NOVEL METHOD FOR TIME-RESOLVED CHARACTERIZATION OF MICROMAGNETIC STRAY FIELDS WITH SCANNING PROBE MICROSCOPY, Surface and interface analysis, 25(7-8), 1997, pp. 533
Authors:
MERTIN W
Citation: W. Mertin, 2-DIMENSIONAL FIELD-MAPPING OF MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS USING ELECTROOPTIC SAMPLING TECHNIQUES, Optical and quantum electronics, 28(7), 1996, pp. 801-817
Authors:
BATINIC M
WEISBRODT B
MERTIN W
KUBALEK E
Citation: M. Batinic et al., COMPARISON OF MEASUREMENT RESULTS OBTAINED BY ELECTRON-BEAM TESTING AND INDIRECT ELECTROOPTIC SAMPLING, Microelectronic engineering, 31(1-4), 1996, pp. 33-40
Authors:
MERTIN W
Citation: W. Mertin, NEW ASPECTS IN ELECTROOPTIC SAMPLING, Microelectronic engineering, 31(1-4), 1996, pp. 365-376
Authors:
HERRMANN WA
SCHERER W
FISCHER RW
BLUMEL J
KLEINE M
MERTIN W
GRUEHN R
MINK J
BOYSEN H
WILSON CC
IBBERSON RM
BACHMANN L
MATTNER M
Citation: Wa. Herrmann et al., MULTIPLE BONDS BETWEEN MAIN-GROUP ELEMENTS AND TRANSITION-METALS .137. POLYMERIC METHYLTRIOXORHENIUM - AN ORGANOMETALLIC NANOSCALE DOUBLE-LAYER STRUCTURE OF CORNER-SHARING REO5(CH3) OCTAHEDRA WITH INTERCALATEDWATER-MOLECULES, Journal of the American Chemical Society, 117(11), 1995, pp. 3231-3243
Authors:
TAENZLER F
MERTIN W
DAVID G
JAGER D
KUBALEK E
Citation: F. Taenzler et al., EXPERIMENTAL CHARACTERIZATION OF THE PERTURBATIONS OF MICROWAVE DEVICES BY THE ELECTROOPTIC PROBE TIP, Microelectronic engineering, 24(1-4), 1994, pp. 123-130
Authors:
MERTIN W
LEYK A
TAENZLER F
NOVAK T
DAVID G
JAGER D
KUBALEK E
Citation: W. Mertin et al., CHARACTERIZATION OF A MMIC BY DIRECT AND INDIRECT ELECTROOPTIC SAMPLING AND BY NETWORK ANALYZER MEASUREMENTS, Microelectronic engineering, 24(1-4), 1994, pp. 377-384
Authors:
DAVID G
REDLICH S
MERTIN W
KUBALEK E
JAGER D
Citation: G. David et al., 2-DIMENSIONAL FIELD-MAPPING IN COPLANAR MMIC-COMPONENTS USING DIRECT ELECTROOPTIC PROBING, Microelectronic engineering, 24(1-4), 1994, pp. 385-392
Authors:
BOHM C
BANGERT J
MERTIN W
KUBALEK E
Citation: C. Bohm et al., TIME-RESOLVED NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Journal of physics. D, Applied physics, 27(10), 1994, pp. 2237-2240
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1-13
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