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Results: 1-14 |
Results: 14

Authors: DEIXLER P TERRY J HAWKINS ID EVANSFREEMAN JH PEAKER AR RUBALDO L MAUDE DK PORTAL JC DOBACZEWSKI L NIELSEN KB LARSEN AN MESLI A
Citation: P. Deixler et al., LAPLACE-TRANSFORM DEEP-LEVEL TRANSIENT SPECTROSCOPY STUDIES OF THE G4GOLD-HYDROGEN COMPLEX IN SILICON, Applied physics letters, 73(21), 1998, pp. 3126-3128

Authors: MESLI A KRINGHOJ P LARSEN AN
Citation: A. Mesli et al., PINNING BEHAVIOR OF GOLD-RELATED LEVELS IN SI USING SI1-XGEX ALLOY LAYERS, Physical review. B, Condensed matter, 56(20), 1997, pp. 13202-13217

Authors: LARSEN AN ORAIFEARTAIGH C BARKLIE RC HOLM B PRIOLO F FRANZO G LULLI G BIANCONI M NIPOTI R LINDNER JKN MESLI A GROB JJ CRISTIANO F HEMMENT PLF
Citation: An. Larsen et al., MEV ION-IMPLANTATION INDUCED DAMAGE IN RELAXED SI1-XGEX, Journal of applied physics, 81(5), 1997, pp. 2208-2218

Authors: GRENIER B MESLI A CALES J CASTEL JP MAURETTE P
Citation: B. Grenier et al., SEVERE HYPERTHERMIA AFTER ACUTE CESSATION OF CONTINUOUS INTRATHECAL BACLOFEN ADMINISTRATION, Annales francaises d'anesthesie et de reanimation, 15(5), 1996, pp. 659-662

Authors: PRIOLO F SPINELLA C ALBERTAZZI E BIANCONI M LULLI G NIPOTI R LINDNER JKN MESLI A BARKLIE RC SEALY L HOLM B LARSEN AN
Citation: F. Priolo et al., ION-IMPLANTATION INDUCED DAMAGE IN RELAXED SI0.75GE0.25, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 301-304

Authors: SIMON L FAURE J MESLI A HEISER T GROB JJ BALLADORE JL
Citation: L. Simon et al., XTEM AND IR ABSORPTION ANALYSIS OF SILICON-CARBIDE PREPARED BY HIGH-TEMPERATURE CARBON IMPLANTATION IN SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 330-333

Authors: HEISER T MESLI A
Citation: T. Heiser et A. Mesli, IRON DIFFUSIVITY IN SILICON - IMPACT OF CHARGE-STATE - COMMENT, Applied physics letters, 68(13), 1996, pp. 1868-1869

Authors: DIANI M MESLI A KUBLER L CLAVERIE A BALLADORE JL AUBEL D PEYRE S HEISER T BISCHOFF JL
Citation: M. Diani et al., OBSERVATION OF SI OUT-DIFFUSION RELATED DEFECTS IN SIC GROWTH ON SI(001), Materials science & engineering. B, Solid-state materials for advanced technology, 29(1-3), 1995, pp. 110-113

Authors: CLAVERIE A FAURE J BALLADORE JL SIMON L MESLI A DIANI M KUBLER L AUBEL D
Citation: A. Claverie et al., A PARTICULAR EPITAXIAL SI1-YCY ALLOY GROWTH MODE ON SI(001) EVIDENCEDBY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY, Journal of crystal growth, 157(1-4), 1995, pp. 420-425

Authors: DIANI M KUBLER L BISCHOFF JL GROB JJ PREVOT B MESLI A
Citation: M. Diani et al., SYNTHESIS OF EPITAXIAL SI1-YCY ALLOYS ON SI(001) WITH HIGH-LEVEL OF NON-USUAL SUBSTITUTIONAL CARBON INCORPORATION, Journal of crystal growth, 157(1-4), 1995, pp. 431-435

Authors: ZAMOUCHE A HEISER T MESLI A
Citation: A. Zamouche et al., INVESTIGATION OF FAST DIFFUSING IMPURITIES IN SILICON BY A TRANSIENT ION DRIFT METHOD, Applied physics letters, 66(5), 1995, pp. 631-633

Authors: MESLI A HEISER T MULHEIM E
Citation: A. Mesli et al., COPPER DIFFUSIVITY IN SILICON - A REEXAMINATION, Materials science & engineering. B, Solid-state materials for advanced technology, 25(2-3), 1994, pp. 141-146

Authors: MONTHEARD JP MESLI A BELFKIRA A RAIHANE M PHAM QT
Citation: Jp. Montheard et al., COPOLYMERIZATION OF VINYLIDENE CYANIDE WITH METHACRYLONITRILE AND CYANOVINYLACETATE C-13 NMR-STUDIES OF THEIR STRUCTURE, Pure and applied chemistry, A31, 1994, pp. 1-8

Authors: HEISER T MESLI A
Citation: T. Heiser et A. Mesli, DETERMINATION OF THE COPPER DIFFUSION-COEFFICIENT IN SILICON FROM TRANSIENT ION-DRIFT, Applied physics. A, Solids and surfaces, 57(4), 1993, pp. 325-328
Risultati: 1-14 |