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Results:
1-9
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Results: 9
Authors:
MOECKLY BH
CHAR K
Citation: Bh. Moeckly et K. Char, RESPONSE TO COMMENT ON PROPERTIES OF INTERFACE-ENGINEERED HIGH T-C JOSEPHSON-JUNCTIONS [APPL. PHYS. LETT. 73, 1745 (1998)], Applied physics letters, 73(12), 1998, pp. 1747-1747
Authors:
SYDOW JP
BUHRMAN RA
MOECKLY BH
Citation: Jp. Sydow et al., BASAL-PLANE OXYGEN VAPOR-PRESSURE OF CO-DOPED YBA2CU3O7-DELTA, Applied physics letters, 72(26), 1998, pp. 3512-3514
Authors:
CHAMBERLAIN D
SYDOW JP
BUHRMAN RA
MOECKLY BH
CHAR K
Citation: D. Chamberlain et al., MICRO-RAMAN SPECTROSCOPY STUDIES OF CO DOPED Y-BA-CU-O THIN-FILMS, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 3658-3661
Authors:
MOECKLY BH
CHAR K
Citation: Bh. Moeckly et K. Char, PROPERTIES OF INTERFACE-ENGINEERED HIGH T-C JOSEPHSON-JUNCTIONS, Applied physics letters, 71(17), 1997, pp. 2526-2528
Authors:
MOECKLY BH
BUHRMAN RA
Citation: Bh. Moeckly et Ra. Buhrman, ELECTROMAGNETIC PROPERTIES OF YBA2CU3O7-DELTA THIN-FILM GRAIN-BOUNDARY WEAK LINKS, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 3414-3417
Authors:
ANTOGNAZZA L
MOECKLY BH
GEBALLE TH
CHAR K
Citation: L. Antognazza et al., PROPERTIES OF HIGH-T-C JOSEPHSON-JUNCTIONS WITH Y0.7CA0.3BA2CU3O7-DELTA BARRIER LAYERS, Physical review. B, Condensed matter, 52(6), 1995, pp. 4559-4567
Authors:
SCOUTEN S
XU YZ
MOECKLY BH
BUHRMAN RA
Citation: S. Scouten et al., LOW-FREQUENCY NOISE IN THE NORMAL-STATE OF THIN-FILM HIGH-TEMPERATURESUPERCONDUCTORS, Physical review. B, Condensed matter, 50(21), 1994, pp. 16121-16124
Authors:
MOECKLY BH
BUHRMAN RA
Citation: Bh. Moeckly et Ra. Buhrman, JOSEPHSON PROPERTIES OF BASAL-PLANE-FACED TILT BOUNDARIES IN YBA2CU3O7-DELTA THIN-FILMS, Applied physics letters, 65(24), 1994, pp. 3126-3128
Authors:
MOECKLY BH
BUHRMAN RA
SULEWSKI PE
Citation: Bh. Moeckly et al., MICRO-RAMAN SPECTROSCOPY OF ELECTROMIGRATION-INDUCED OXYGEN VACANCY AGGREGATION IN YBA2CU3O7-DELTA, Applied physics letters, 64(11), 1994, pp. 1427-1429
Risultati:
1-9
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