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Results:
1-7
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Results: 7
Authors:
DAVID L
KOVACS B
MOJZES I
PECZ B
LABAR J
DOBOS L
Citation: L. David et al., ELECTRICAL AND STRUCTURAL CHARACTERIZATION OF NI GE/N-GAAS INTERFACE/, Vacuum, 50(3-4), 1998, pp. 395-398
Authors:
DAVID L
KOVACS B
MOJZES I
PECZ B
LABAR J
Citation: L. David et al., ELECTRICAL AND MICROSTRUCTURE ANALYSIS OF NI GE/N-GAAS INTERFACE/, Thin solid films, 323(1-2), 1998, pp. 212-216
Authors:
MOJZES I
KOVACS B
SCHUSZTER M
KUN I
MATE L
DOBOS L
DAVID L
Citation: I. Mojzes et al., FRACTAL BEHAVIOR OF THE SURFACE OF IN-SITU HEAT-TREATED METAL-INP CONTACTS, Thin solid films, 317(1-2), 1998, pp. 69-71
Authors:
DAVIDA L
KOVACS B
MOJZES I
KINCSES Z
DOBOS L
Citation: L. Davida et al., THE ELECTRICAL-PROPERTIES OF AL NI/GE/N-GAAS INTERFACES/, Microelectronics and reliability, 38(5), 1998, pp. 787-793
Authors:
KOCSIS Z
KINCSES ZS
HOPP B
RIPKA G
MOJZES I
Citation: Z. Kocsis et al., NOISE INVESTIGATION OF ULTRAVIOLET-LASER INDUCED GRAIN-STRUCTURE IN POLYIMIDE FILMS, Journal of electronic materials, 25(3), 1996, pp. 549-551
Authors:
MALINA V
MORO L
MICHELI V
MOJZES I
Citation: V. Malina et al., AU-BE RU/AU MULTILAYER METALLIZATION AS A STABLE OHMIC CONTACT SCHEMETO P-TYPE INP/, Semiconductor science and technology, 11(7), 1996, pp. 1121-1126
Authors:
KOCSIS Z
VINCZE G
TOTH L
PECZ B
RIPKA G
MOJZES I
Citation: Z. Kocsis et al., STRUCTURAL CHARACTERIZATION OF EXCIMER-LASER TREATED POLYIMIDE FOIL, Physica status solidi. a, Applied research, 150(2), 1995, pp. 11-13
Risultati:
1-7
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