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Results: 1-9 |
Results: 9
ON THE SEPARATION OF GRAVITATION AND INERTIA AND THE DETERMINATION OFTHE RELATIVISTIC GRAVITY-FIELD IN THE CASE OF FREE MOTION
Authors: SHEN WB MORITZ H
Citation: Wb. Shen et H. Moritz, ON THE SEPARATION OF GRAVITATION AND INERTIA AND THE DETERMINATION OFTHE RELATIVISTIC GRAVITY-FIELD IN THE CASE OF FREE MOTION, JOURNAL OF GEODESY, 70(10), 1996, pp. 633-644
OBSERVATION OF FLUORESCENCE BACKGROUND SUPPRESSION IN RAMAN-SCATTERING ON SINGLE MICROPARTICLES
Authors: KAISER T ESEN C MORITZ H BORCHERS M SCHWEIGER G
Citation: T. Kaiser et al., OBSERVATION OF FLUORESCENCE BACKGROUND SUPPRESSION IN RAMAN-SCATTERING ON SINGLE MICROPARTICLES, Berichte der Bunsengesellschaft fur Physikalische Chemie, 100(2), 1996, pp. 119-122
LINEAR RAMAN-SPECTROSCOPY ON DROPLET CHAINS - A NEW EXPERIMENTAL-METHOD FOR THE ANALYSIS OF FAST TRANSPORT PROCESSES AND REACTIONS ON MICROPARTICLES
Authors: VEHRING R MORITZ H NIEKAMP D SCHWEIGER G HEINRICH P
Citation: R. Vehring et al., LINEAR RAMAN-SPECTROSCOPY ON DROPLET CHAINS - A NEW EXPERIMENTAL-METHOD FOR THE ANALYSIS OF FAST TRANSPORT PROCESSES AND REACTIONS ON MICROPARTICLES, Applied spectroscopy, 49(9), 1995, pp. 1215-1224
THE HAMILTONIAN-STRUCTURE OF REFRACTION AND OF THE GRAVITY-FIELD
Authors: MORITZ H
Citation: H. Moritz, THE HAMILTONIAN-STRUCTURE OF REFRACTION AND OF THE GRAVITY-FIELD, Manuscripta geodaetica, 20(1), 1994, pp. 52-60
AERIAL IMAGE STUDIES OF AN ADVANCED DEEP-UV EXPOSURE SYSTEM
Authors: GRASSMANN A BOTTIGER U FISCHER T MORITZ H
Citation: A. Grassmann et al., AERIAL IMAGE STUDIES OF AN ADVANCED DEEP-UV EXPOSURE SYSTEM, Microelectronic engineering, 23(1-4), 1994, pp. 155-158
INCREASING THE DEFOCUS LATITUDE OF A DEEP UV SYSTEM
Authors: REUHMANHUISKEN M KUIJPERS RJ DIJKSTRA J BOTTIGER U MORITZ H
Citation: M. Reuhmanhuisken et al., INCREASING THE DEFOCUS LATITUDE OF A DEEP UV SYSTEM, Microelectronic engineering, 23(1-4), 1994, pp. 159-162
RESIST THICKNESS INFLUENCE ON DEPTH OF FOCUS - A KEY QUESTION FOR ADVANCED I-LINE AND DUV LITHOGRAPHY
Authors: BOETTIGER U FISCHER T GRASSMANN A MORITZ H REUHMANHUISKEN M
Citation: U. Boettiger et al., RESIST THICKNESS INFLUENCE ON DEPTH OF FOCUS - A KEY QUESTION FOR ADVANCED I-LINE AND DUV LITHOGRAPHY, Microelectronic engineering, 23(1-4), 1994, pp. 163-166
PERFORMANCE DATA OF AN ENVIRONMENTALLY STABLE DEEP UV POSITIVE RESIST
Authors: FISCHER T BOETTIGER U GRASSMANN A MORITZ H BINDER H FUNHOFF D SCHWALM R
Citation: T. Fischer et al., PERFORMANCE DATA OF AN ENVIRONMENTALLY STABLE DEEP UV POSITIVE RESIST, Microelectronic engineering, 23(1-4), 1994, pp. 311-314
GAS-SOURCE MOLECULAR-BEAM EPITAXY OF FESI2 SI(111) HETEROSTRUCTURES/
Authors: SCHAFER HC ROSEN B MORITZ H RIZZI A LENGELER B LUTH H GERTHSEN D
Citation: Hc. Schafer et al., GAS-SOURCE MOLECULAR-BEAM EPITAXY OF FESI2 SI(111) HETEROSTRUCTURES/, Applied physics letters, 62(18), 1993, pp. 2271-2273
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