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Results:
1-16
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Results: 16
Authors:
Chen, IS
Roeder, JF
Kim, DJ
Maria, JP
Kingon, AI
Citation: Is. Chen et al., Metalorganic chemical vapor deposition Pb(Zr,Ti)O-3 and selected lower electrode structures as a pathway to integrated piezoelectric microelectromechanical systems, J VAC SCI B, 19(5), 2001, pp. 1833-1840
Authors:
Baumann, PK
Streiffer, SK
Bai, GR
Ghosh, K
Auciello, O
Thompson, C
Stemmer, S
Rao, RA
Eom, CB
Xu, F
Trolier-McKinstry, S
Kim, DJ
Maria, JP
Kingon, AI
Citation: Pk. Baumann et al., Epitaxial Pb(Mg1/3Nb2/3)O-3-PbTiO3 thin films grown by MOCVD, INTEGR FERR, 35(1-4), 2001, pp. 1881-1888
Authors:
Cann, DP
Maria, JP
Randall, CA
Citation: Dp. Cann et al., Relationship between wetting and electrical contact properties of pure metals and alloys on semiconducting barium titanate ceramics, J MATER SCI, 36(20), 2001, pp. 4969-4976
Authors:
Lee, SY
Custodio, MCC
Lim, HJ
Feigelson, RS
Maria, JP
Trolier-McKinstry, S
Citation: Sy. Lee et al., Growth and characterization of Pb(Mg1/3Nb2/3)O-3 and Pb(Mg1/3Nb2/3)O-3-PbTiO3 thin films using solid source MOCVD techniques, J CRYST GR, 226(2-3), 2001, pp. 247-253
Authors:
Maria, JP
Wicaksana, D
Kingon, AI
Busch, B
Schulte, H
Garfunkel, E
Gustafsson, T
Citation: Jp. Maria et al., High temperature stability in lanthanum and zirconia-based gate dielectrics, J APPL PHYS, 90(7), 2001, pp. 3476-3482
Authors:
Stemmer, S
Maria, JP
Kingon, AI
Citation: S. Stemmer et al., Structure and stability of La2O3/SiO2 layers on Si(001), APPL PHYS L, 79(1), 2001, pp. 102-104
Authors:
Maria, JP
Cheek, K
Streiffer, S
Kim, SH
Dunn, G
Kingon, A
Citation: Jp. Maria et al., Lead zirconate titanate thin films on base-metal foils: An approach for embedded high-permittivity passive components, J AM CERAM, 84(10), 2001, pp. 2436-2438
Authors:
Kingon, AI
Maria, JP
Streiffer, SK
Citation: Ai. Kingon et al., Alternative dielectrics to silicon dioxide for memory and logic devices, NATURE, 406(6799), 2000, pp. 1032-1038
Authors:
Christman, JA
Kim, SH
Maiwa, H
Maria, JP
Rodriguez, BJ
Kingon, AI
Nemanich, RJ
Citation: Ja. Christman et al., Spatial variation of ferroelectric properties in Pb(Zr-0.3, Ti-0.7)O-3 thin films studied by atomic force microscopy, J APPL PHYS, 87(11), 2000, pp. 8031-8034
Authors:
Kim, SH
Kim, DJ
Maria, JP
Kingon, AI
Streiffer, SK
Im, J
Auciello, O
Krauss, AR
Citation: Sh. Kim et al., Influence of Pt heterostructure bottom electrodes on SrBi2Ta2O9 thin film properties, APPL PHYS L, 76(4), 2000, pp. 496-498
Authors:
Maria, JP
McKinstry, HL
Trolier-McKinstry, S
Citation: Jp. Maria et al., Origin of preferential orthorhombic twinning in SrRuO3 epitaxial thin firms, APPL PHYS L, 76(23), 2000, pp. 3382-3384
Authors:
Maiwa, H
Christman, JA
Kim, SH
Kim, DJ
Maria, JP
Chen, B
Streiffer, SK
Kingon, AI
Citation: H. Maiwa et al., Measurement of piezoelectric displacements of Pb(Zr, Ti)O-3 thin films using a double-beam interferometer, JPN J A P 1, 38(9B), 1999, pp. 5402-5405
Authors:
Kim, SH
Kim, DJ
Im, J
Streiffer, SK
Auciello, O
Maria, JP
Kingon, AI
Citation: Sh. Kim et al., Impact of changes in the Pt heterostructure bottom electrodes on the ferroelectric properties of SBT thin films, INTEGR FERR, 26(1-4), 1999, pp. 955-970
Authors:
Kim, DJ
Kim, SH
Maria, JP
Kingon, AI
Citation: Dj. Kim et al., Influences on imprint failure of SrBi2Ta2O9 thin film capacitors, INTEGR FERR, 25(1-4), 1999, pp. 691-701
Authors:
Maiwa, H
Maria, JP
Christman, JA
Kim, SH
Streiffer, K
Kingon, AI
Citation: H. Maiwa et al., Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients, INTEGR FERR, 24(1-4), 1999, pp. 139-146
Authors:
Maria, JP
Hackenberger, W
Trolier-McKinstry, S
Citation: Jp. Maria et al., Phase development and electrical property analysis of pulsed laser deposited Pb(Mg1/3Nb2/3)O-3-PbTiO3 (70/30) epitaxial thin films, J APPL PHYS, 84(9), 1998, pp. 5147-5154
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