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Results:
1-11
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Results: 11
Authors:
Chen, NC
Bedair, HS
McKay, B
Bowers, MB
Mazure, C
Citation: Nc. Chen et al., Clozapine in the treatment of aggression in an adolescent with autistic disorder, J CLIN PSY, 62(6), 2001, pp. 479-480
Authors:
Mikolajick, T
Dehm, C
Hartner, W
Kasko, I
Kastner, MJ
Nagel, N
Moert, M
Mazure, C
Citation: T. Mikolajick et al., FeRAM technology for high density applications, MICROEL REL, 41(7), 2001, pp. 947-950
Authors:
Hartner, W
Schindler, G
Bosk, P
Gabric, Z
Kastner, M
Beitel, G
Mikolajick, T
Dehm, C
Mazure, C
Citation: W. Hartner et al., Integration of H-2 barriers for ferroelectric memories based on SrBi2Ta2O9(SBT), INTEGR FERR, 31(1-4), 2000, pp. 273-284
Degradation mechanisms of SrBi2Ta2O9 ferroelectric thin film capacitors during forming gas annealing
Authors:
Hartner, W
Bosk, P
Schindler, G
Schroeder, H
Waser, R
Dehm, C
Mazure, C
Citation: W. Hartner et al., Degradation mechanisms of SrBi2Ta2O9 ferroelectric thin film capacitors during forming gas annealing, INTEGR FERR, 31(1-4), 2000, pp. 341-350
Authors:
Jacobs, S
Mazure, C
Prigerson, H
Citation: S. Jacobs et al., Diagnostic criteria for traumatic grief, DEATH STUD, 24(3), 2000, pp. 185-199
Authors:
Landau, SA
Junghans, N
Weiss, PA
Kolbesen, BO
Olbrich, A
Schindler, G
Hartner, W
Hintermaier, F
Dehm, C
Mazure, C
Citation: Sa. Landau et al., Scanning probe microscopy - a tool for the investigation of high-k materials, APPL SURF S, 157(4), 2000, pp. 387-392
Authors:
Ross, RS
Viazov, SO
Holtzer, CD
Beyou, A
Monnet, A
Mazure, C
Roggendorf, M
Citation: Rs. Ross et al., Genotyping of hepatitis C virus isolates using CLIP sequencing, J CLIN MICR, 38(10), 2000, pp. 3581-3584
Authors:
Hartner, W
Schindler, G
Weinrich, V
Ahlstedt, M
Schroeder, H
Waser, R
Dehm, C
Mazure, C
Citation: W. Hartner et al., Influence of dry etching using argon on structural and electrical properties of crystalline and non-crystalline SrBi2Ta2O9 thin films, INTEGR FERR, 27(1-4), 1999, pp. 1257-1269
Authors:
Dehm, C
Hartner, W
Schindler, G
Bergmann, R
Hasler, B
Kasko, I
Kastner, M
Schiele, M
Weinrich, V
Mazure, C
Citation: C. Dehm et al., Review of SrBi2Ta2O9 thin films capacitor processing, INTEGR FERR, 26(1-4), 1999, pp. 899-915
Authors:
Roeder, JF
Hendrix, BC
Hintermaier, F
Desrochers, DA
Baum, TH
Bhandari, G
Chappuis, M
Van Buskirk, PC
Dehm, C
Fritsch, E
Nagel, N
Wendt, H
Cerva, H
Honlein, W
Mazure, C
Citation: Jf. Roeder et al., Ferroelectric strontium bismuth tantalate thin films deposited by metalorganic chemical vapour deposition (MOCVD), J EUR CERAM, 19(6-7), 1999, pp. 1463-1466
Authors:
Beitel, G
Wendt, H
Fritsch, E
Weinrich, V
Engelhardt, M
Hasler, B
Rohr, T
Bergmann, R
Scheler, U
Malek, KH
Nagel, N
Gschwandtner, A
Pamler, W
Honlein, W
Dehm, C
Mazure, C
Citation: G. Beitel et al., A novel low-temperature (Ba,Sr)TiO3 (BST) process with Ti/TiN barrier for Gbit DRAM applications, MICROEL ENG, 48(1-4), 1999, pp. 299-302
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