Authors: Harame, DL Meyerson, BS

Citation: Dl. Harame et Bs. Meyerson, The early history of IBM's SiGe mixed signal technology, IEEE DEVICE, 48(11), 2001, pp. 2555-2567

Authors: Meyerson, BS

Citation: Bs. Meyerson, Silicon : germanium-based mixed-signal technology for optimization of wired and wireless telecommunications, IBM J RES, 44(3), 2000, pp. 391-407

Authors: Meyerson, BS

Citation: Bs. Meyerson, Low-temperature Si and Si : Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition: Process fundamentals (Reprinted from IBM Journal of Research and Development, vol 34, 1990), IBM J RES, 44(1-2), 2000, pp. 132-141

Authors: Mathew, SJ Niu, GF Dubbelday, WB Cressler, JD Ott, JA Chu, JO Mooney, PM Kavanagh, KL Meyerson, BS Lagnado, I

Citation: Sj. Mathew et al., Hole confinement and low-frequency noise in SiGe pFET's on silicon-on-sapphire, IEEE ELEC D, 20(4), 1999, pp. 173-175