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Results: 1-11 |
Results: 11
X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
Authors: Ulyanenkov, A Inaba, K Mikulik, P Darowski, N Omote, K Pietsch, U Grenzer, J Forchel, A
Citation: A. Ulyanenkov et al., X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires, J PHYS D, 34(10A), 2001, pp. A179-A182
Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
Authors: Mikulik, P Jergel, M Baumbach, T Majkova, E Pincik, E Luby, S Ortega, L Tucoulou, R Hudek, P Kostic, I
Citation: P. Mikulik et al., Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings, J PHYS D, 34(10A), 2001, pp. A188-A192
Multilayer gratings for X-UV optics
Authors: Jergel, M Mikulik, P Majkova, E Pincik, E Luby, S Brunel, M Hudek, P
Citation: M. Jergel et al., Multilayer gratings for X-UV optics, ACT PHYS SL, 50(4), 2000, pp. 427-438
X-ray diffraction from quantum wires and quantum dots
Authors: Zhuang, Y Stangl, J Darhuber, AA Bauer, G Mikulik, P Holy, V Darowski, N Pietsch, U
Citation: Y. Zhuang et al., X-ray diffraction from quantum wires and quantum dots, J MAT S-M E, 10(3), 1999, pp. 215-221
The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction
Authors: Litzman, O Mikulik, P
Citation: O. Litzman et P. Mikulik, The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction, J PHYS-COND, 11(30), 1999, pp. 5767-5779
X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering
Authors: Mikulik, P Baumbach, T
Citation: P. Mikulik et T. Baumbach, X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering, PHYS REV B, 59(11), 1999, pp. 7632-7643
High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si
Authors: Stangl, J Holy, V Darhuber, AA Mikulik, P Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: J. Stangl et al., High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si, J PHYS D, 32(10A), 1999, pp. A71-A74
Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy
Authors: Jergel, M Mikulik, P Majkova, E Luby, S Senderak, R Pincik, E Brunel, M Hudek, P Kostic, I Konecnikova, A
Citation: M. Jergel et al., Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy, J PHYS D, 32(10A), 1999, pp. A220-A223
Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction
Authors: Zhuang, Y Holy, V Stangl, J Darhuber, AA Mikulik, P Zerlauth, S Schaffler, F Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: Y. Zhuang et al., Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction, J PHYS D, 32(10A), 1999, pp. A224-A229
Structural characterization of a lamellar W/Si multilayer grating
Authors: Jergel, M Mikulik, P Majkova, E Luby, S Senderak, R Pincik, E Brunel, M Hudek, P Kostic, I Konecnikova, A
Citation: M. Jergel et al., Structural characterization of a lamellar W/Si multilayer grating, J APPL PHYS, 85(2), 1999, pp. 1225-1227
Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering
Authors: Stangl, J Holy, V Mikulik, P Bauer, G Kegel, I Metzger, TH Schmidt, OG Lange, C Eberl, K
Citation: J. Stangl et al., Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering, APPL PHYS L, 74(25), 1999, pp. 3785-3787
Risultati: 1-11 |