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Results:
1-20
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Results: 20
Authors:
Lee, H
Lee, JH
Shin, H
Park, YJ
Min, HS
Citation: H. Lee et al., Low-frequency noise degradation caused by STI interface effects in SOI-MOSFETs, IEEE ELEC D, 22(9), 2001, pp. 449-451
Authors:
Lee, KI
Kim, J
Park, YJ
Min, HS
Citation: Ki. Lee et al., Simple frequency-domain analysis of MOSFET - Including nonquasi-static effect, IEEE COMP A, 20(7), 2001, pp. 867-876
Authors:
Ryou, CR
Hwang, SW
Shin, H
Lee, CH
Park, YJ
Min, HS
Citation: Cr. Ryou et al., Three-dimensional simulation of discrete oxide charge effects in 0.1 mu m MOSFETs, SOL ST ELEC, 45(7), 2001, pp. 1165-1172
Authors:
Chung, IY
Park, YJ
Min, HS
Citation: Iy. Chung et al., SOI MOSFET structure with a junction-type body contact for suppression of pass gate leakage, IEEE DEVICE, 48(7), 2001, pp. 1360-1365
Authors:
Chung, IY
Park, YJ
Min, HS
Citation: Iy. Chung et al., A charge pumping device with a potential barrier using inversion charge transfer, IEEE DEVICE, 48(6), 2001, pp. 1216-1221
Authors:
Ha, DH
Byon, S
Min, HS
Lee, KW
Citation: Dh. Ha et al., Oxygen states on the Cu-O chain of YBa2-xSrxCu3Oy, PHYSICA C, 341, 2000, pp. 633-634
Authors:
Kim, YS
Min, HS
Choi, WJ
Kim, SC
Citation: Ys. Kim et al., Dynamic mechanical modeling of PEI/dicyanate semi-IPNs, POLYM ENG S, 40(3), 2000, pp. 665-675
Authors:
Lee, C
Kim, JS
Shin, H
Park, YJ
Min, HS
Citation: C. Lee et al., A new hole mobility model for hydrodynamic simulation, MICROEL REL, 40(12), 2000, pp. 2019-2022
Authors:
Lee, H
Lee, JH
Park, YJ
Min, HS
Citation: H. Lee et al., A dual body SOI structure for mixed analog-digital mode circuits, IEEE DEVICE, 47(8), 2000, pp. 1617-1623
Authors:
Shin, JS
Chung, IY
Park, YJ
Min, HS
Citation: Js. Shin et al., A new charge pump without degradation in threshold voltage due to body effect, IEEE J SOLI, 35(8), 2000, pp. 1227-1230
Authors:
Ring, HZ
Vameghi-Meyers, V
Nikolic, JM
Min, HS
Black, DL
Francke, U
Citation: Hz. Ring et al., Mapping of the KHSRP gene to a region of conserved synteny on human chromosome 19p13.3 and mouse chromosome 17, GENOMICS, 56(3), 1999, pp. 350-352
Authors:
Ring, HZ
Vameghi-Meyers, V
Min, HS
Nikolic, JM
Black, DL
Francke, U
Citation: Hz. Ring et al., The mouse Fubp gene maps near the distal end of chromosome 3, GENOMICS, 56(3), 1999, pp. 357-358
Authors:
Lee, H
Hwang, JM
Park, YJ
Min, HS
Citation: H. Lee et al., A leakage current mechanism caused by the interaction of residual oxidation stress and high-energy ion implantation impact in advanced CMOS technology, IEEE ELEC D, 20(5), 1999, pp. 251-253
Authors:
Bak, DS
Lee, J
Min, HS
Citation: Ds. Bak et al., Dynamics of BPS states in the Dirac-Born-Infeld theory - art. no. 045011, PHYS REV D, 5904(4), 1999, pp. 5011
Authors:
Min, HS
Kim, H
Park, DK
Lee, SY
Yoo, SK
Yoon, DH
Citation: Hs. Min et al., Bifurcation of a periodic instanton in a decay-rate transition, PHYS LETT B, 469(1-4), 1999, pp. 193-197
Authors:
Min, HS
Kim, SC
Citation: Hs. Min et Sc. Kim, Fracture toughness of polysulfone/epoxy semi-IPN with morphology spectrum, POLYM BULL, 42(2), 1999, pp. 221-227
Authors:
Kim, KR
Kim, K
Kang, DJ
Park, SY
Park, MK
Kim, YG
Min, HS
Min, DH
Citation: Kr. Kim et al., The East Sea (Japan Sea) in change: A story of dissolved oxygen, MAR TECH SJ, 33(1), 1999, pp. 15-22
Authors:
Kook, YJ
Lee, JH
Park, YJ
Min, HS
Citation: Yj. Kook et al., Surface accumulated lateral npn BJT's characteristics in SOI NMOSFET's, IEEE DEVICE, 46(9), 1999, pp. 1917-1919
Authors:
Kang, DG
Park, YJ
Min, HS
Citation: Dg. Kang et al., A simple voltage scaling formula for low-power CMOS circuits, IEEE DEVICE, 46(4), 1999, pp. 803-805
Authors:
Hong, SJ
Kim, JJ
Park, YJ
Min, HS
Citation: Sj. Hong et al., Analysis of the spurious negative resistance of PN junction avalanche breakdown, IEEE DEVICE, 46(1), 1999, pp. 230-236
Risultati:
1-20
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