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Results: 1-8 |
Results: 8

Authors: Filipek, SM Jacob, I Paul-Boncour, V Percheron-Guegan, A Marchuk, I Mogilyanski, D Pielaszek, J
Citation: Sm. Filipek et al., Investigation of ZrFe2 and ZrCo2 under very high pressure of gaseous hydrogen and deuterium, POL J CHEM, 75(12), 2001, pp. 1921-1926

Authors: Mogilyanski, D Gartstein, E Blumin, M Fekete, D Kohler, R
Citation: D. Mogilyanski et al., Microstructural aspects of island nucleation process in elastically relaxed LPOMVPE grown In0.2Ga0.8As/GaAs multilayer, J PHYS D, 34(10A), 2001, pp. A19-A24

Authors: Gartstein, E Mandelbrot, M Mogilyanski, D
Citation: E. Gartstein et al., Instrumental origin effects in triple-axis diffraction, J PHYS D, 34(10A), 2001, pp. A57-A63

Authors: Shames, AI Rozenberg, E Gorodetsky, G Revzin, B Mogilyanski, D Pelleg, J Felner, I
Citation: Ai. Shames et al., Experimental ESR studies of nano-size magnetic heterogeneities in polycrystalline La0.5Pb0.5MnO3 and La1.34Sn0.66Mn2O7, J MAGN MAGN, 203, 1999, pp. 259-261

Authors: Gartstein, E Mogilyanski, D Metzger, H
Citation: E. Gartstein et al., Morphology, strain and microstructure interrelation in Si-on-sapphire heterostructure, SURF REV L, 6(6), 1999, pp. 1003-1013

Authors: Mogilyanski, D Gartstein, E Blumin, M Fekete, D Opitz, R Kohler, R
Citation: D. Mogilyanski et al., Investigation of the interface roughness in a LPOMVPE grown AlAs GaAs multilayer, J PHYS D, 32(10A), 1999, pp. A239-A244

Authors: Gartstein, E Mogilyanski, D Frumin, N
Citation: E. Gartstein et al., Interfacial microstructure in Si-on-sapphire heterostructure, J CRYST GR, 205(1-2), 1999, pp. 64-70

Authors: Mogilyanski, D Blumin, M Gartstein, E Opitz, R Kohler, R
Citation: D. Mogilyanski et al., Structural characterization of LPOMVPE grown AlAs/GaAs multilayers, J CRYST GR, 199, 1999, pp. 1070-1076
Risultati: 1-8 |