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Results: 1-14 |
Results: 14

Authors: Gupta, S Weiner, BR Morell, G
Citation: S. Gupta et al., Spectroscopic ellipsometry studies of nanocrystalline carbon thin films deposited by HFCVD, DIAM RELAT, 10(11), 2001, pp. 1968-1972

Authors: Gonzalez, JA Figueroa, OL Weiner, BR Morell, G
Citation: Ja. Gonzalez et al., Study of the effects of low-energy electron bombardment during the chemical vapor deposition of diamond, J MATER RES, 16(1), 2001, pp. 293-295

Authors: Gupta, S Morell, G Katiyar, RS Abelson, JR Jin, HC Balbert, I
Citation: S. Gupta et al., Interference enhanced Raman scattering of hydrogenated amorphous silicon revisited, J RAMAN SP, 32(1), 2001, pp. 23-25

Authors: Gupta, S Weiner, BR Morell, G
Citation: S. Gupta et al., Ex situ spectroscopic ellipsometry investigation of the layered structure of polycrystalline diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition, J APPL PHYS, 90(3), 2001, pp. 1280-1285

Authors: Gupta, S Weiss, BL Weiner, BR Morell, G
Citation: S. Gupta et al., Study of the electron field emission and microstructure correlation in nanocrystalline carbon thin films, J APPL PHYS, 89(10), 2001, pp. 5671-5675

Authors: Gupta, S Weiss, BL Weiner, BR Morell, G
Citation: S. Gupta et al., Electron field emission from sulfur-incorporated nanocrystalline carbon thin films, APPL PHYS L, 79(21), 2001, pp. 3446-3448

Authors: Lambert, A Sadir, R Brisson, C Morell, G
Citation: A. Lambert et al., In vivo subcellular target compartments of interferon-gamma and interferon-gamma receptor (alpha- and beta-chains) in mouse liver, CYTOKINE, 12(6), 2000, pp. 715-719

Authors: Morell, G Vargas, IM Manso, JY Guzman, JR Weiner, BR
Citation: G. Morell et al., In situ phase-modulated ellipsometry study of the surface damaging processof silicon under atomic hydrogen, SOL ST COMM, 116(4), 2000, pp. 217-220

Authors: Gupta, S Morell, G Katiyar, RS Gilbert, DR Singh, RK
Citation: S. Gupta et al., Effects of low temperatures, low pressures and seeding over the crystalline quality, yield and stress of diamond films grown by ECR-assisted chemicalvapor deposition, J MATER SCI, 35(24), 2000, pp. 6245-6249

Authors: Gupta, S Katiyar, RS Gilbert, DR Singh, RK Morell, G
Citation: S. Gupta et al., Microstructural studies of diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition, J APPL PHYS, 88(10), 2000, pp. 5695-5702

Authors: Morell, G Cancel, LM Figueroa, OL Gonzalez, JA Weiner, BR
Citation: G. Morell et al., Structural evolution during chemical vapor deposition of diamond thin films, J APPL PHYS, 88(10), 2000, pp. 5716-5719

Authors: Morell, G Canales, E Weiner, BR
Citation: G. Morell et al., In situ measurements of methane and acetylene concentrations in a CVD reactor by infrared spectroscopy, DIAM RELAT, 8(2-5), 1999, pp. 166-170

Authors: Gupta, S Morell, G Katiyar, RS Gilbert, DR Singh, RK
Citation: S. Gupta et al., Study of diamond films grown at low temperatures and pressures by ECR-assisted CVD, DIAM RELAT, 8(2-5), 1999, pp. 185-188

Authors: Torres, DI Llopis, J Perez, W Morell, G Katiyar, RS
Citation: Di. Torres et al., Luminescence and Raman scattering of thermally reduced CaSZ crystals, J LUMINESC, 83-4, 1999, pp. 481-485
Risultati: 1-14 |