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Results: 1-13 |
Results: 13
Photoionization spectra of CH3I and C2H5I perturbed by CF4 and c-C4F8: electron scattering in halocarbon gases
Authors: Evans, CM Morikawa, E Findley, GL
Citation: Cm. Evans et al., Photoionization spectra of CH3I and C2H5I perturbed by CF4 and c-C4F8: electron scattering in halocarbon gases, J PHYS B, 34(17), 2001, pp. 3607-3615
Electronic structure and molecular orientation at thin film surfaces of pendant-group polymers studied by outermost surface spectroscopy using metastable atoms
Authors: Okudaira, KK Kera, S Setoyama, H Morikawa, E Ueno, N
Citation: Kk. Okudaira et al., Electronic structure and molecular orientation at thin film surfaces of pendant-group polymers studied by outermost surface spectroscopy using metastable atoms, J ELEC SPEC, 121(1-3), 2001, pp. 225-232
Calculated photoelectron angular distributions of omega-(n-pyrrolyl)alkanethiol self-assembled monolayers for distinguishing between different arrangements of the pyrrole groups
Authors: Hasegawa, S Yakushi, K Inokuchi, H Kamiya-Okudaira, K Ueno, N Seki, K Morikawa, E Saile, V
Citation: S. Hasegawa et al., Calculated photoelectron angular distributions of omega-(n-pyrrolyl)alkanethiol self-assembled monolayers for distinguishing between different arrangements of the pyrrole groups, J ELEC SPEC, 120(1-3), 2001, pp. 121-129
Angle-resolved photoemission measurements of omega-(n-pyrrolyl)alkanethiolself-assembled monolayers using in-situ sample preparation apparatus
Authors: Hasegawa, S Horigome, T Yakushi, K Inokuchi, H Okudaira-Kamiya, K Ueno, N Seki, K Willicut, RJ McCarley, RL Morikawa, E Saile, V
Citation: S. Hasegawa et al., Angle-resolved photoemission measurements of omega-(n-pyrrolyl)alkanethiolself-assembled monolayers using in-situ sample preparation apparatus, J ELEC SPEC, 113(2-3), 2001, pp. 101-107
Pressure studies of subthreshold photoionization: CH3I, C2H5I and C6H6 perturbed by Ar and SF6
Authors: Evans, CM Morikawa, E Findley, GL
Citation: Cm. Evans et al., Pressure studies of subthreshold photoionization: CH3I, C2H5I and C6H6 perturbed by Ar and SF6, CHEM PHYS, 264(3), 2001, pp. 419-435
Surface electronic structure and molecular orientation of poly(9-vinylcarbazole) thin film: ARUPS and NEXAFS
Authors: Okudaira, KK Morikawa, E Hasegawa, S Ishii, H Azuma, Y Imamura, M Shimada, H Seki, K Ueno, N
Citation: Kk. Okudaira et al., Surface electronic structure and molecular orientation of poly(9-vinylcarbazole) thin film: ARUPS and NEXAFS, NUCL INST A, 467, 2001, pp. 1233-1236
Pendant group orientation of poly(2-vinylnaphthalene) thin film surface studied by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS)
Authors: Morikawa, E Saile, V Okudaira, KK Azuma, Y Meguro, K Harada, Y Seki, K Hasegawa, S Ueno, N
Citation: E. Morikawa et al., Pendant group orientation of poly(2-vinylnaphthalene) thin film surface studied by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS), J CHEM PHYS, 112(23), 2000, pp. 10476-10481
Photoemission study of direct photomicromachining in poly(vinylidene fluoride)
Authors: Morikawa, E Choi, JW Manohara, HM Ishii, H Seki, K Okudaira, KK Ueno, N
Citation: E. Morikawa et al., Photoemission study of direct photomicromachining in poly(vinylidene fluoride), J APPL PHYS, 87(8), 2000, pp. 4010-4016
Thin crystalline functional group copolymer poly(vinylidene fluoride-trifluoroethylene) film patterning using synchrotron radiation
Authors: Choi, JW Manohara, HM Morikawa, E Sprunger, PT Dowben, PA Palto, SP
Citation: Jw. Choi et al., Thin crystalline functional group copolymer poly(vinylidene fluoride-trifluoroethylene) film patterning using synchrotron radiation, APPL PHYS L, 76(3), 2000, pp. 381-383
Pattern transfer by direct photo etching of poly(vinylidene fluoride) using X rays
Authors: Manohara, HM Morikawa, E Choi, J Sprunger, PT
Citation: Hm. Manohara et al., Pattern transfer by direct photo etching of poly(vinylidene fluoride) using X rays, J MICROEL S, 8(4), 1999, pp. 417-422
Surface molecular orientation of poly(2-vinylnaphalene) thin films: ARUPS and NEXAFS studies
Authors: Okudaira, KK Morikawa, E Hite, DA Hasegawa, S Ishii, H Imamura, M Shimada, H Azuma, Y Meguro, K Harada, Y Saile, V Seki, K Ueno, N
Citation: Kk. Okudaira et al., Surface molecular orientation of poly(2-vinylnaphalene) thin films: ARUPS and NEXAFS studies, J ELEC SPEC, 103, 1999, pp. 389-392
Electronic structure and molecular orientation of well-ordered polyethylene oligomer (n-C44H90) on Cu(100) and Au(111) surfaces studied by UV photoemission and low energy electron diffraction
Authors: Ishii, H Morikawa, E Tang, SJ Yoshimura, D Ito, E Okudaira, K Miyamae, T Hasegawa, S Sprunger, PT Ueno, N Seki, K Saile, V
Citation: H. Ishii et al., Electronic structure and molecular orientation of well-ordered polyethylene oligomer (n-C44H90) on Cu(100) and Au(111) surfaces studied by UV photoemission and low energy electron diffraction, J ELEC SPEC, 103, 1999, pp. 559-564
Linearly polarized CuK-edge absorption spectroscopy of CuGeO3: Orbital population, band dispersion, and exchange interactions
Authors: Cruz, DZ Abbate, M Tolentino, H Schiling, PJ Morikawa, E Fujimori, A Akimitsu, J
Citation: Dz. Cruz et al., Linearly polarized CuK-edge absorption spectroscopy of CuGeO3: Orbital population, band dispersion, and exchange interactions, PHYS REV B, 59(19), 1999, pp. 12450-12456
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