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Results: 1-11 |
Results: 11
Microstructural properties of Cu(In,Ga)Se-2 thin films used in high-efficiency devices
Authors: Hasoon, FS Yan, Y Althani, H Jones, KM Moutinho, HR Alleman, J Al-Jassim, MM Noufi, R
Citation: Fs. Hasoon et al., Microstructural properties of Cu(In,Ga)Se-2 thin films used in high-efficiency devices, THIN SOL FI, 387(1-2), 2001, pp. 1-5
TEM, AFM, and cathodoluminescence characterization of CdTe thin films
Authors: Al-Jassim, MM Yan, Y Moutinho, HR Romero, MJ Dhere, RD Jones, KM
Citation: Mm. Al-jassim et al., TEM, AFM, and cathodoluminescence characterization of CdTe thin films, THIN SOL FI, 387(1-2), 2001, pp. 246-250
Cross-sectional electrostatic force microscopy of thin-film solar cells
Authors: Ballif, C Moutinho, HR Al-Jassim, MM
Citation: C. Ballif et al., Cross-sectional electrostatic force microscopy of thin-film solar cells, J APPL PHYS, 89(2), 2001, pp. 1418-1424
Alternative procedure for the fabrication of close-spaced sublimated CdTe solar cells
Authors: Moutinho, HR Dhere, RG Ballif, C Al-Jassim, MM Kazmerski, LL
Citation: Hr. Moutinho et al., Alternative procedure for the fabrication of close-spaced sublimated CdTe solar cells, J VAC SCI A, 18(4), 2000, pp. 1599-1603
CdS/CdTe interface analysis by transmission electron microscopy
Authors: Dhere, RG Al-Jassim, MM Yan, Y Jones, KM Moutinho, HR Gessert, TA Sheldon, P Kazmerski, LL
Citation: Rg. Dhere et al., CdS/CdTe interface analysis by transmission electron microscopy, J VAC SCI A, 18(4), 2000, pp. 1604-1608
Cross-sectional atomic force microscopy imaging of polycrystalline thin films
Authors: Ballif, C Moutinho, HR Hasoon, FS Dhere, RG Al-Jassim, MM
Citation: C. Ballif et al., Cross-sectional atomic force microscopy imaging of polycrystalline thin films, ULTRAMICROS, 85(2), 2000, pp. 61-71
Effect of surface steps on the microstructure of lateral composition modulation
Authors: Follstaedt, DM Reno, JL Jones, ED Lee, SR Norman, AG Moutinho, HR Mascarenhas, A Twesten, RD
Citation: Dm. Follstaedt et al., Effect of surface steps on the microstructure of lateral composition modulation, APPL PHYS L, 77(5), 2000, pp. 669-671
Interface morphology of CdS thin films grown on cadmium stannate and glasssubstrates studied by grazing incidence x-ray scattering
Authors: Huang, S Soo, YL Bechmann, M Kao, YH Wu, X Coutts, TJ Dhere, R Moutinho, HR
Citation: S. Huang et al., Interface morphology of CdS thin films grown on cadmium stannate and glasssubstrates studied by grazing incidence x-ray scattering, J VAC SCI A, 17(5), 1999, pp. 2685-2691
Investigation of induced recrystallization and stress in close-spaced sublimated and radio-frequency magnetron sputtered CdTe thin films
Authors: Moutinho, HR Dhere, RG Al-Jassim, MM Levi, DH Kazmerski, LL
Citation: Hr. Moutinho et al., Investigation of induced recrystallization and stress in close-spaced sublimated and radio-frequency magnetron sputtered CdTe thin films, J VAC SCI A, 17(4), 1999, pp. 1793-1798
The influence of post-deposition treatment on the physical properties of CdTe films deposited by stacked elemental layer processing
Authors: Cruz, LR Kazmerski, LL Moutinho, HR Hasoon, F Dhere, RG de Avillez, R
Citation: Lr. Cruz et al., The influence of post-deposition treatment on the physical properties of CdTe films deposited by stacked elemental layer processing, THIN SOL FI, 350(1-2), 1999, pp. 44-48
Ge-related faceting and segregation during the growth of metastable (GaAs)(1-x)(Ge-2)(x) alloy layers by metal-organic vapor-phase epitaxy
Authors: Norman, AG Olson, JM Geisz, JF Moutinho, HR Mason, A Al-Jassim, MM Vernon, SM
Citation: Ag. Norman et al., Ge-related faceting and segregation during the growth of metastable (GaAs)(1-x)(Ge-2)(x) alloy layers by metal-organic vapor-phase epitaxy, APPL PHYS L, 74(10), 1999, pp. 1382-1384
Risultati: 1-11 |