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Results: 1-6 |
Results: 6

Authors: Mrstik, BJ Hughes, HL McMarr, PJ Gouker, P
Citation: Bj. Mrstik et al., Electron and hole trapping in thermal oxides that have been ion implanted, MICROEL ENG, 59(1-4), 2001, pp. 285-289

Authors: Mrstik, BJ Hughes, HL McMarr, PJ Lawrence, RK Ma, DI Isaacson, IP Walker, RA
Citation: Bj. Mrstik et al., Hole and electron trapping in ion implanted thermal oxides and SIMOX, IEEE NUCL S, 47(6), 2000, pp. 2189-2195

Authors: Mrstik, BJ Afanas'ev, VV Stesmans, A McMarr, PJ
Citation: Bj. Mrstik et al., Relationship between hole trapping and oxide density in thermally grown SiO2, MICROEL ENG, 48(1-4), 1999, pp. 143-146

Authors: Deng, BC Yu, ZX Xu, G Mrstik, BJ Tong, SY
Citation: Bc. Deng et al., Multilayer structural determination of the GaAs((1)over-bar(1)over-bar(1)over-bar)2x2 reconstruction by automated tensor LEED, PHYS REV B, 59(15), 1999, pp. 9775-9778

Authors: Mrstik, BJ Afanas'ev, VV Stesmans, A McMarr, PJ Lawrence, RK
Citation: Bj. Mrstik et al., Relationship between oxide density and charge trapping in SiO2 films, J APPL PHYS, 85(9), 1999, pp. 6577-6588

Authors: Mrstik, BJ McMarr, PJ Lawrence, RK Hughes, HL
Citation: Bj. Mrstik et al., A study of the radiation sensitivity of non-crystalline SiO2 films using spectroscopic ellipsometry, IEEE NUCL S, 45(6), 1998, pp. 2450-2457
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