Authors:
Deng, BC
Yu, ZX
Xu, G
Mrstik, BJ
Tong, SY
Citation: Bc. Deng et al., Multilayer structural determination of the GaAs((1)over-bar(1)over-bar(1)over-bar)2x2 reconstruction by automated tensor LEED, PHYS REV B, 59(15), 1999, pp. 9775-9778
Citation: Bj. Mrstik et al., A study of the radiation sensitivity of non-crystalline SiO2 films using spectroscopic ellipsometry, IEEE NUCL S, 45(6), 1998, pp. 2450-2457