Authors: Gossner, H Muller-Lynch, T Esmark, K Stecher, M

Citation: H. Gossner et al., Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology, MICROEL REL, 41(3), 2001, pp. 385-393

Authors: Furbock, C Pogany, D Litzenberger, M Gornik, E Seliger, N Gossner, H Muller-Lynch, T Stecher, M Werner, W

Citation: C. Furbock et al., Interferometric temperature mapping during ESD stress and failure analysisof smart power technology ESD protection devices, J ELECTROST, 49(3-4), 2000, pp. 195-213

Authors: Furbock, C Litzenberger, M Pogany, D Gornik, E Seliger, N Muller-Lynch, T Stecher, M Gossner, H Werner, W

Citation: C. Furbock et al., Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress, MICROEL REL, 39(6-7), 1999, pp. 925-930

Authors: Pogany, D Seliger, N Litzenberger, M Gossner, H Stecher, M Muller-Lynch, T Werner, W Gornik, E

Citation: D. Pogany et al., Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices, MICROEL REL, 39(6-7), 1999, pp. 1143-1148