Authors:
BAEK KH
KIM CI
KWON KH
KIM TH
CHANG EG
YUN SJ
YOON YS
KIM SG
NAM KS
Citation: Kh. Baek et al., PASSIVATION ROLE OF FLUORINE ON THE ANTICORROSION OF ALCU FILMS AFTERPLASMA-ETCHING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1469-1472
Citation: M. Park et al., HIGH-QUALITY CONFORMAL SILICON-OXIDE FILMS PREPARED BY MULTISTEP SPUTTERING PECVD AND CHEMICAL-MECHANICAL POLISHING, Journal of electronic materials, 27(11), 1998, pp. 1262-1267
Authors:
KOH WS
YOON SY
KWON BM
JEONG TC
NAM KS
HAN MY
Citation: Ws. Koh et al., CINNAMALDEHYDE INHIBITS LYMPHOCYTE-PROLIFERATION AND MODULATES T-CELLDIFFERENTIATION, International journal of immunopharmacology, 20(11), 1998, pp. 643-660
Authors:
BAEK KH
YOON YS
PARK JM
KWON KH
KIM CI
NAM KS
Citation: Kh. Baek et al., A FLUORINE-RELATED PASSIVATION LAYER ON ETCHED AL-CU (1-PERCENT) ALLOY SURFACES ON SILICON AFTER SF6 PLASMA TREATMENTS, Materials letters, 35(3-4), 1998, pp. 183-187
Authors:
BAEK WS
KWON SC
LEE JY
LEE SR
RHA JJ
NAM KS
Citation: Ws. Baek et al., THE EFFECT OF TI ION-BOMBARDMENT ON THE INTERFACIAL STRUCTURE BETWEENTIN AND IRON NITRIDE, Thin solid films, 323(1-2), 1998, pp. 146-152
Citation: Sg. Kim et al., ANALYSIS OF SI1-XGEX ON SI HETEROSTRUCTURES GROWN BY MBE AS A FUNCTION OF SUBSTRATE-TEMPERATURE, Journal of crystal growth, 186(3), 1998, pp. 375-381
Citation: M. Park et al., THE DETAILED ANALYSIS OF HIGH-Q CMOS-COMPATIBLE MICROWAVE SPIRAL INDUCTORS IN SILICON TECHNOLOGY, I.E.E.E. transactions on electron devices, 45(9), 1998, pp. 1953-1959
Authors:
KWON KH
YUN SJ
KIM CI
PARK JM
BAEK KH
YOON YS
KIM SG
NAM KS
Citation: Kh. Kwon et al., THE EFFECTS OF FLUORINE PASSIVATION USING SF6 PLASMA ON THE CORROSIONOF AL(CU 1-PERCENT) AT GRAIN-BOUNDARIES, Journal of the Electrochemical Society, 145(3), 1998, pp. 1044-1048
Citation: Ys. Yoon et al., AN AMORPHOUS-SILICON LOCAL INTERCONNECTION (ASLI) CMOS WITH SELF-ALIGNED SOURCE DRAIN AND ITS ELECTRICAL CHARACTERISTICS/, ETRI journal, 19(4), 1997, pp. 402-413
Citation: S. Lee et al., A NOVEL-APPROACH TO EXTRACTING SMALL-SIGNAL MODEL PARAMETERS OF SILICON MOSFETS, IEEE microwave and guided wave letters, 7(3), 1997, pp. 75-77
Citation: M. Park et al., HIGH-Q CMOS-COMPATIBLE MICROWAVE INDUCTORS USING DOUBLE-METAL INTERCONNECTION SILICON TECHNOLOGY, IEEE microwave and guided wave letters, 7(2), 1997, pp. 45-47
Citation: Sj. Yun et al., DEPENDENCE OF ATOMIC LAYER-DEPOSITED AL2O3 FILMS CHARACTERISTICS ON GROWTH TEMPERATURE AND AL PRECURSORS OF AL(CH3)(3) AND ALCL3, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(6), 1997, pp. 2993-2997
Citation: Ks. Nam et Y. Nagao, FACILE CONVERSION OF ACTIVE AMIDE TO ESTER BY ACIDIC AL2O3 AND RESIN IN ALCOHOL SOLUTION - SYNTHESIS OF 5-SUBSTITUTED-2(5H)-FURANONES, Bulletin of the Korean Chemical Society, 18(11), 1997, pp. 1208-1210
Citation: Jd. Kim et al., 2-DIMENSIONAL MODELING FOR THE CURRENT-DENSITY DISTRIBUTION IN A HEAVILY-DOPED SEMICONDUCTOR RESISTOR, International journal of electronics, 82(1), 1997, pp. 19-25
Citation: Jd. Kim et al., PLASMA ELECTRON-DENSITY GENERATED BY A SEMICONDUCTOR BRIDGE AS A FUNCTION OF INPUT ENERGY AND LAND MATERIAL, I.E.E.E. transactions on electron devices, 44(6), 1997, pp. 1022-1026
Citation: Ys. Yoon et al., CMOS DEVICE WITH SELF-ALIGNED SOURCE DRAIN USING AMORPHOUS-SILICON LOCAL INTERCONNECTION LAYER/, Electronics Letters, 33(5), 1997, pp. 389-390
Authors:
SUH KS
LEE JL
PARK HH
KIM CH
LEE JJ
NAM KS
Citation: Ks. Suh et al., PASSIVATION EFFECT OF (NH4)(2)S-X TREATMENT ON GAAS SURFACE BEFORE PHOTO-RESIST AND O-2 PROCESSES, Materials science & engineering. B, Solid-state materials for advanced technology, 37(1-3), 1996, pp. 172-176
Citation: Jh. Kim et al., FABRICATION OF THIN-FILM TRANSISTORS USING A SI SI1-XGEX/SI TRIPLE-LAYER FILM ON A SIO2 SUBSTRATE/, IEEE electron device letters, 17(5), 1996, pp. 205-207
Authors:
KIM SG
LEE SC
CHO KI
LEE JJ
NAM KS
NAHM S
BAE IH
Citation: Sg. Kim et al., STRUCTURAL STUDIES OF SIGE SI FILMS GROWN ON SI(001) SUBSTRATES/, Journal of the Korean Physical Society, 29(1), 1996, pp. 68-73
Citation: Jm. Snyder et al., DETERMINATION OF VOLATILE AND SEMIVOLATILE CONTAMINANTS IN MEAT BY SUPERCRITICAL-FLUID EXTRACTION GAS-CHROMATOGRAPHY MASS-SPECTROMETRY, Journal of the Science of Food and Agriculture, 72(1), 1996, pp. 25-30
Citation: Jh. Kim et al., FORMATION MECHANISM OF CRYSTALLITES IN THE AS-DEPOSITED MIXED-PHASE LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITION SILICON THIN-FILMS, Journal of applied physics, 79(3), 1996, pp. 1794-1800