Authors: HO F HOU AS NECHAY BA BLOOM DM

Citation: F. Ho et al., ULTRAFAST VOLTAGE-CONTRAST SCANNING PROBE MICROSCOPY, Nanotechnology, 7(4), 1996, pp. 385-389

Authors: HOU AS NECHAY BA HO F BLOOM DM

Citation: As. Hou et al., SCANNING PROBE MICROSCOPY FOR TESTING ULTRAFAST ELECTRONIC DEVICES, Optical and quantum electronics, 28(7), 1996, pp. 819-841

Authors: NECHAY BA HO F HOU AS BLOOM DM

Citation: Ba. Nechay et al., APPLICATIONS OF AN ATOMIC-FORCE MICROSCOPE VOLTAGE PROBE WITH ULTRAFAST TIME RESOLUTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1369-1374