Authors:
FRANGIS N
VANTENDELOO G
VANLANDUYT J
MURET P
NGUYEN TTA
Citation: N. Frangis et al., STRUCTURAL CHARACTERIZATION OF ERBIUM SILICIDE THIN-FILMS ON AN SI(111) SUBSTRATE, Journal of alloys and compounds, 234(2), 1996, pp. 244-250
Authors:
DEBBAGH F
AMEZIANE EL
AZIZAN M
BRUNEL M
NGUYEN TTA
Citation: F. Debbagh et al., SOME ANNEALING EFFECTS ON RF-SPUTTERED CU TE/CDTE STRUCTURE/, Materials science & engineering. B, Solid-state materials for advanced technology, 38(3), 1996, pp. 223-227
Authors:
FRANGIS N
VANTENDELOO G
VANLANDUYT J
MURET P
NGUYEN TTA
Citation: N. Frangis et al., ELECTRON-MICROSCOPY CHARACTERIZATION OF ERBIUM SILICIDE THIN-FILMS GROWN ON A SI(111) SUBSTRATE, Applied surface science, 102, 1996, pp. 163-168
Authors:
MURET P
NGUYEN TTA
FRANGIS N
VANTENDELOO G
VANLANDUYT J
Citation: P. Muret et al., PHOTOELECTRIC AND ELECTRICAL RESPONSES OF SEVERAL ERBIUM SILICIDE SILICON INTERFACES/, Applied surface science, 102, 1996, pp. 173-177
Citation: P. Muret et al., BAND DISCONTINUITIES AT BETA-FESI2 SI HETEROJUNCTIONS AS DEDUCED FROMTHEIR PHOTOELECTRIC AND ELECTRICAL-PROPERTIES/, Semiconductor science and technology, 9(7), 1994, pp. 1395-1403
Authors:
ECHCHAMIKH E
AZIZAN M
AMEZIANE EL
BENNOUNA A
BRUNEL M
NGUYEN TTA
Citation: E. Echchamikh et al., STRUCTURAL AND CHEMICAL-ANALYSIS OF C-H,O SI-H,O MULTILAYERS DEPOSITED BY REACTIVE RF-SPUTTERING/, Solar energy materials and solar cells, 31(2), 1993, pp. 187-195