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Authors: GRETILLAT MA LINDER C DOMMANN A STAUFERT G DEROOIJ NF NICOLET MA
Citation: Ma. Gretillat et al., SURFACE-MICROMACHINED TA-SI-N BEAMS FOR USE IN MICROMECHANICS, Journal of micromechanics and microengineering, 8(2), 1998, pp. 88-90

Authors: BACHLI A NICOLET MA BAUD L JAUSSAUD C MADAR R
Citation: A. Bachli et al., NICKEL FILM ON (001)SIC - THERMALLY-INDUCED REACTIONS, Materials science & engineering. B, Solid-state materials for advanced technology, 56(1), 1998, pp. 11-23

Authors: FLEMING JG ROHERTYOSMUN E SMITH PM CUSTER JS KIM YD KACSICH T NICOLET MA GALEWSKI CJ
Citation: Jg. Fleming et al., GROWTH AND PROPERTIES OF W-SI-N DIFFUSION-BARRIERS DEPOSITED BY CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 320(1), 1998, pp. 10-14

Authors: KACSICH T KOLAWA E FLEURIAL JP CAILLAT T NICOLET MA
Citation: T. Kacsich et al., FILMS OF NI-7 AT-PERCENT V, PD, PT AND TA-SI-N AS DIFFUSION-BARRIERS FOR COPPER ON BI2TE3, Journal of physics. D, Applied physics (Print), 31(19), 1998, pp. 2406-2411

Authors: SUN X KOLAWA E IM S GARLAND C NICOLET MA
Citation: X. Sun et al., EFFECT OF SI IN REACTIVELY SPUTTERED TI-SI-N FILMS ON STRUCTURE AND DIFFUSION BARRIER PERFORMANCE, Applied physics A: Materials science & processing, 65(1), 1997, pp. 43-45

Authors: LINDER C DOMMANN A STAUFERT G NICOLET MA
Citation: C. Linder et al., TERNARY TA-SI-N FILMS FOR SENSORS AND ACTUATORS, Sensors and actuators. A, Physical, 61(1-3), 1997, pp. 387-391

Authors: GASSER SM BACHLI A GARLAND CM KOLAWA E NICOLET MA
Citation: Sm. Gasser et al., REACTION OF THIN NI FILMS WITH (001) 3C-SIC AT 700-DEGREES-C, Microelectronic engineering, 37-8(1-4), 1997, pp. 529-534

Authors: IM S EISEN F NICOLET MA TANNER MO WANG KL THEODORE ND
Citation: S. Im et al., STRAIN-CONSERVING DOPING OF A PSEUDOMORPHIC METASTABLE GE0.06SI0.94 LAYER ON SI(100) BY LOW-DOSE BF2+ IMPLANTATION, Journal of applied physics, 81(4), 1997, pp. 1695-1699

Authors: IM S SONG JH LIE DYC EISEN F ATWATER H NICOLET MA
Citation: S. Im et al., SIGEC ALLOY LAYER FORMATION BY HIGH-DOSE C+ IMPLANTATIONS INTO PSEUDOMORPHIC METASTABLE GE0.08SI0.92 ON SI(100), Journal of applied physics, 81(4), 1997, pp. 1700-1703

Authors: SUN X REID JS KOLAWA E NICOLET MA
Citation: X. Sun et al., REACTIVELY SPUTTERED TI-SI-N FILMS .1. PHYSICAL-PROPERTIES, Journal of applied physics, 81(2), 1997, pp. 656-663

Authors: SUN X REID JS KOLAWA E NICOLET MA RUIZ RP
Citation: X. Sun et al., REACTIVELY SPUTTERED TI-SI-N FILMS .2. DIFFUSION-BARRIERS FOR AL AND CU METALLIZATIONS ON SI, Journal of applied physics, 81(2), 1997, pp. 664-671

Authors: VINH LT EDDRIEF M MAHAN JE VANTOMME A SONG JH NICOLET MA
Citation: Lt. Vinh et al., THE VAN-DER-WAALS EPITAXIAL-GROWTH OF GASE ON SI(111), Journal of applied physics, 81(11), 1997, pp. 7289-7294

Authors: SUN X SCHNEIDER S GEYER U JOHNSON WL NICOLET MA
Citation: X. Sun et al., OXIDATION AND CRYSTALLIZATION OF AN AMORPHOUS ZR60AL15NI25 ALLOY, Journal of materials research, 11(11), 1996, pp. 2738-2743

Authors: LIE DYC SONG JH EISEN F NICOLET MA THEODORE ND
Citation: Dyc. Lie et al., STRAIN EVOLUTION AND DOPANT ACTIVATION IN P-IMPLANTED METASTABLE PSEUDOMORPHIC SI(100) G(0.12)SI(0.88)/, Journal of electronic materials, 25(1), 1996, pp. 87-92

Authors: PAN ETS NICOLET MA
Citation: Ets. Pan et Ma. Nicolet, LANGMUIR-BLODGETT-FILMS IN METAL-SILICON CONTACTS, Materials chemistry and physics, 46(2-3), 1996, pp. 269-273

Authors: SHALISH I GASSER SM KOLAWA E NICOLET MA RUIZ RP
Citation: I. Shalish et al., GOLD METALLIZATION FOR ALUMINUM NITRIDE, Thin solid films, 289(1-2), 1996, pp. 166-169

Authors: KUBOTA H EASTERBROOK M TOKUNAGA M SAKATA I NAGATA M NICOLET MA
Citation: H. Kubota et al., MODEL OF OXIDATION OF TIN IN ION-BEAM-ASSISTED DEPOSITION PROCESS, Thin solid films, 282(1-2), 1996, pp. 108-111

Authors: IM S LIE DYC NICOLET MA
Citation: S. Im et al., ADVANTAGE OF SHORT OVER LONG ANNEALING TO ACTIVATE AS IMPLANTED IN METASTABLE PSEUDOMORPHIC GE0.08SI0.92 LAYERS ON SI(100), Journal of applied physics, 79(9), 1996, pp. 7389-7391

Authors: REID JS KOLAWA E GARLAND CM NICOLET MA CARDONE F GUPTA D RUIZ RP
Citation: Js. Reid et al., AMORPHOUS (MO, TA, OR W)-SI-N DIFFUSION-BARRIERS FOR AL METALLIZATIONS, Journal of applied physics, 79(2), 1996, pp. 1109-1115

Authors: LIE DYC IM S NICOLET MA THEODORE ND
Citation: Dyc. Lie et al., SHORT AND LONG ANNEALING OF HIGH-DOSE ARSENIC-IMPLANTED PSEUDOMORPHICGEXSI1-X ON SI(100), Journal of applied physics, 79(11), 1996, pp. 8341-8348

Authors: DAUKSHER WJ RESNICK DJ CUMMINGS KD BAKER J GREGORY RB THEODORE ND CHAN JA JOHNSON WA MOGAB CJ NICOLET MA REID JS
Citation: Wj. Dauksher et al., METHOD FOR FABRICATING A LOW-STRESS X-RAY MASK USING ANNEALABLE AMORPHOUS REFRACTORY COMPOUNDS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 3103-3108

Authors: BAUD L JAUSSAUD C MADAR R BERNARD C CHEN JS NICOLET MA
Citation: L. Baud et al., INTERFACIAL REACTIONS OF W THIN-FILM ON SINGLE-CRYSTAL (001)BETA-SIC, Materials science & engineering. B, Solid-state materials for advanced technology, 29(1-3), 1995, pp. 126-130

Authors: CHEN JS BACHLI A NICOLET MA BAUD L JAUSSAUD C MADAR R
Citation: Js. Chen et al., CONTACT RESISTIVITY OF RE, PT AND TA FILMS ON N-TYPE BETA-SIC - PRELIMINARY-RESULTS, Materials science & engineering. B, Solid-state materials for advanced technology, 29(1-3), 1995, pp. 185-189

Authors: NICOLET MA
Citation: Ma. Nicolet, TERNARY AMORPHOUS METALLIC THIN-FILMS AS DIFFUSION-BARRIERS FOR CU METALLIZATION, Applied surface science, 91(1-4), 1995, pp. 269-276

Authors: NICOLET MA LIU WS
Citation: Ma. Nicolet et Ws. Liu, OXIDATION OF GESI, Microelectronic engineering, 28(1-4), 1995, pp. 185-191
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