Authors: LI Y NXUMALO JN THOMSON DJ

Citation: Y. Li et al., 2-DIMENSIONAL IMAGING OF CHARGE-CARRIER PROFILES USING LOCAL METAL-SEMICONDUCTOR CAPACITANCE-VOLTAGE MEASUREMENT, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 457-462

Authors: NXUMALO JN SHIMIZU DT THOMSON DJ SIMARDNORMADIN M

Citation: Jn. Nxumalo et al., HIGH-RESOLUTION CROSS-SECTIONAL IMAGING OF MOSFETS BY SCANNING RESISTANCE MICROSCOPY, IEEE electron device letters, 18(2), 1997, pp. 71-73

Authors: NXUMALO JN SHIMIZU DT THOMSON DJ

Citation: Jn. Nxumalo et al., CROSS-SECTIONAL IMAGING OF SEMICONDUCTOR-DEVICE STRUCTURES BY SCANNING RESISTANCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 386-389

Authors: HYKAWY JG BARBER RC SHARMA KS AARTS KJ NXUMALO JN DUCKWORTH HE

Citation: Jg. Hykawy et al., MASSES OF STABLE XENON ISOTOPES - CHECK FOR INTERNAL CONSISTENCY VIA ION-CYCLOTRON RESONANCE MASS-SPECTROMETRY - COMMENT, Physical review. C. Nuclear physics, 50(2), 1994, pp. 1249-1250

Authors: NXUMALO JN HYKAWY JG AARTS KJ BARBER RC SHARMA KS DUCKWORTH HE

Citation: Jn. Nxumalo et al., THE ATOMIC MASS OF SI-28, Physics letters. Section B, 312(4), 1993, pp. 388-390

Authors: HYKAWY JG NXUMALO JN UNGER PP LANDER CA PETERS RD BARBER RC SHARMA KS DUCKWORTH HE

Citation: Jg. Hykawy et al., PRECISE DETERMINATION OF THE MASS DIFFERENCE GE-76 SE-76 AND A DERIVED UPPER LIMIT ON THE MAJORANA MASS OF THE ELECTRON NEUTRINO, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 329(3), 1993, pp. 423-432