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Results: 1-15 |
Results: 15
Calcium L-edge XANES study of some calcium compounds
Authors: Naftel, SJ Sham, TK Yiu, YM Yates, BW
Citation: Sj. Naftel et al., Calcium L-edge XANES study of some calcium compounds, J SYNCHROTR, 8, 2001, pp. 255-257
X-ray excited optical luminescence (XEOL) studies of CaF2 at the Ca L-3,L-2-edge
Authors: Naftel, SJ Yiu, YM Sham, TK Yates, BW
Citation: Sj. Naftel et al., X-ray excited optical luminescence (XEOL) studies of CaF2 at the Ca L-3,L-2-edge, J ELEC SPEC, 119(2-3), 2001, pp. 215-220
Micro-synchrotron X-ray fluorescence of cadmium-challenged corn roots
Authors: Naftel, SJ Martin, RR Sham, TK Macfie, SM Jones, KW
Citation: Sj. Naftel et al., Micro-synchrotron X-ray fluorescence of cadmium-challenged corn roots, J ELEC SPEC, 119(2-3), 2001, pp. 235-239
Threshold behavior of the Cu L3M4,5M4,5 Auger effect of Cu metal at the L-3 edge - art. no. 115101
Authors: Coulthard, I Sham, TK Hu, YF Naftel, SJ Kim, PS Freeland, JW
Citation: I. Coulthard et al., Threshold behavior of the Cu L3M4,5M4,5 Auger effect of Cu metal at the L-3 edge - art. no. 115101, PHYS REV B, 6411(11), 2001, pp. 5101
Multichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dots
Authors: Zhang, P Naftel, SJ Sham, TK
Citation: P. Zhang et al., Multichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dots, J APPL PHYS, 90(6), 2001, pp. 2755-2759
X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge
Authors: Sun, XH Tang, YH Zhang, P Naftel, SJ Sammynaiken, R Sham, TK Peng, HY Zhang, YF Wong, NB Lee, ST
Citation: Xh. Sun et al., X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge, J APPL PHYS, 90(12), 2001, pp. 6379-6383
Soft x-ray-excited luminescence and optical x-ray absorption fine structures of tris (8-hydroxyquinoline) aluminum
Authors: Naftel, SJ Zhang, P Kim, PS Sham, TK Coulthard, I Antel, WJ Freeland, JW Frigo, SP Fung, MK Lee, ST Hu, YF Yates, BW
Citation: Sj. Naftel et al., Soft x-ray-excited luminescence and optical x-ray absorption fine structures of tris (8-hydroxyquinoline) aluminum, APPL PHYS L, 78(13), 2001, pp. 1847-1849
Resonant Auger studies of metallic systems
Authors: Coulthard, I Antel, WJ Frigo, SP Freeland, JW Moore, J Calaway, WS Pellin, MJ Mendelsohn, M Sham, TK Naftel, SJ Stampfl, APJ
Citation: I. Coulthard et al., Resonant Auger studies of metallic systems, J VAC SCI A, 18(4), 2000, pp. 1955-1958
X-ray excited optical luminescence (XEOL): a potential tool for OELD studies
Authors: Sham, TK Sammynaiken, R Zhu, YJ Zhang, P Coulthard, I Naftel, SJ
Citation: Tk. Sham et al., X-ray excited optical luminescence (XEOL): a potential tool for OELD studies, THIN SOL FI, 363(1-2), 2000, pp. 318-321
Porous silicon: A template for the preparation of nanophase metals and bimetallic aggregates
Authors: Coulthard, I Sammynaiken, R Naftel, SJ Zhang, P Sham, TK
Citation: I. Coulthard et al., Porous silicon: A template for the preparation of nanophase metals and bimetallic aggregates, PHYS ST S-A, 182(1), 2000, pp. 157-162
The role of oxygen in the photoluminescence of porous silicon: Some recentobservations
Authors: Naftel, SJ Coulthard, I Jiang, DT Sham, TK Yates, BW Tan, KH
Citation: Sj. Naftel et al., The role of oxygen in the photoluminescence of porous silicon: Some recentobservations, PHYS ST S-A, 182(1), 2000, pp. 373-378
Influence of sample oxidation on the nature of optical luminescence from porous silicon
Authors: Coulthard, I Antel, WJ Freeland, JW Sham, TK Naftel, SJ Zhang, P
Citation: I. Coulthard et al., Influence of sample oxidation on the nature of optical luminescence from porous silicon, APPL PHYS L, 77(4), 2000, pp. 498-500
Study of the electronic structure of Au-V bimetallics using X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge structure (XANES)
Authors: Naftel, SJ Bzowski, A Sham, TK
Citation: Sj. Naftel et al., Study of the electronic structure of Au-V bimetallics using X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge structure (XANES), J ALLOY COM, 283(1-2), 1999, pp. 5-11
Co L-3,2-edge and multi-detection channel XAFS studies of Co-Si interactions
Authors: Naftel, SJ Sham, TK
Citation: Sj. Naftel et Tk. Sham, Co L-3,2-edge and multi-detection channel XAFS studies of Co-Si interactions, J SYNCHROTR, 6, 1999, pp. 526-528
Electronic structure of nickel silicide in subhalf-micron lines and blanket films: An x-ray absorption fine structures study at the Ni and Si L-3,L-2edge
Authors: Naftel, SJ Coulthard, I Sham, TK Xu, DX Erickson, L Das, SR
Citation: Sj. Naftel et al., Electronic structure of nickel silicide in subhalf-micron lines and blanket films: An x-ray absorption fine structures study at the Ni and Si L-3,L-2edge, APPL PHYS L, 74(19), 1999, pp. 2893-2895
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