Authors:
Furumiya, M
Hatano, K
Murakami, I
Kawasaki, T
Ogawa, C
Nakashiba, Y
Citation: M. Furumiya et al., A 1/3-in 1.3 M-pixel single-layer electrode CCD with a high-frame-rate skip mode, IEEE DEVICE, 48(9), 2001, pp. 1915-1921
Authors:
Furumiya, M
Suwazono, S
Morimoto, M
Nakashiba, Y
Kawakami, Y
Nakano, T
Satoh, T
Katoh, S
Syohji, D
Utsumi, H
Taniji, Y
Mutoh, N
Orihara, K
Teranishi, N
Citation: M. Furumiya et al., A 30 frames/s 2/3-in 1.3 M-pixel progressive scan IT-CCD image sensor, IEEE DEVICE, 48(9), 2001, pp. 1922-1928
Authors:
Yamada, T
Hatano, K
Morimoto, M
Furumiya, M
Nakashiba, Y
Uchiya, S
Tanabe, A
Kawakami, Y
Nakano, T
Kawai, S
Suwazono, S
Utsumi, H
Katoh, S
Syohji, D
Taniji, Y
Mutoh, N
Orihara, K
Teranishi, N
Hokari, Y
Citation: T. Yamada et al., A 1/2-in 1.3 M-pixel progressive-scan IT-CCD for digital still camera applications, IEEE DEVICE, 48(2), 2001, pp. 222-230
Authors:
Furumiya, M
Ohkubo, H
Muramatsu, Y
Kurosawa, S
Okamoto, F
Fujimoto, Y
Nakashiba, Y
Citation: M. Furumiya et al., High-sensitivity and no-crosstalk pixel technology for embedded CMOS imagesensor, IEEE DEVICE, 48(10), 2001, pp. 2221-2227
Authors:
Tanabe, A
Kudoh, Y
Kawakami, Y
Masubuchi, K
Kawai, S
Yamada, T
Morimoto, M
Arai, K
Hatano, K
Furumiya, M
Nakashiba, Y
Mutoh, N
Orihara, K
Teranishi, N
Citation: A. Tanabe et al., Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors, IEEE DEVICE, 47(9), 2000, pp. 1700-1706
Authors:
Murakami, I
Nakano, T
Hatano, K
Nakashiba, Y
Furumiya, M
Nagata, T
Kawasaki, T
Utsumi, H
Uchiya, S
Arai, K
Mutoh, N
Kohno, A
Teranishi, N
Hokari, Y
Citation: I. Murakami et al., Technologies to improve photo-sensitivity and reduce VOD shutter voltage for CCD image sensors, IEEE DEVICE, 47(8), 2000, pp. 1566-1572