Authors: Pagey, MP Schrimpf, RD Galloway, KF Nicklaw, CJ Ikeda, S Kamohara, S

Citation: Mp. Pagey et al., A hydrogen-transport-based interface-trap-generation model for hot-carriesreliability prediction, IEEE ELEC D, 22(6), 2001, pp. 290-292

Authors: Nicklaw, CJ Pagey, MP Pantelides, ST Fleetwood, DM Schrimpf, RD Galloway, KF Wittig, JE Howard, BM Taw, E McNeil, WH Conley, JF

Citation: Cj. Nicklaw et al., Defects and nanocrystals generated by Si implantation into a-SiO2, IEEE NUCL S, 47(6), 2000, pp. 2269-2275

Authors: Milanowski, RJ Pagey, MP Massengill, LW Schrimpf, RD Wood, ME Offord, BW Graves, RJ Galloway, KF Nicklaw, CJ Kelley, EP

Citation: Rj. Milanowski et al., TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs, IEEE NUCL S, 45(6), 1998, pp. 2593-2599