AAAAAA

   
Results: 1-8 |
Results: 8

Authors: Akiyama, T Gautsch, S de Rooij, NF Staufer, U Niedermann, P Howald, L Muller, D Tonin, A Hidber, HR Pike, WT Hecht, MH
Citation: T. Akiyama et al., Atomic force microscope for planetary applications, SENS ACTU-A, 91(3), 2001, pp. 321-325

Authors: Hantschel, T Slesazeck, S Niedermann, P Eyben, P Vandervorst, W
Citation: T. Hantschel et al., Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes, MICROEL ENG, 57-8, 2001, pp. 749-754

Authors: Trenkler, T Hantschel, T Stephenson, R De Wolf, P Vandervorst, W Hellemans, L Malave, A Buchel, D Oesterschulze, E Kulisch, W Niedermann, P Sulzbach, T Ohlsson, O
Citation: T. Trenkler et al., Evaluating probes for "electrical" atomic force microscopy, J VAC SCI B, 18(1), 2000, pp. 418-427

Authors: Meyer, T Klemenc, M von Kanel, H Niedermann, P
Citation: T. Meyer et al., Diamond tips in low temperature scanning tunneling microscopy, SURF SCI, 470(1-2), 2000, pp. 164-170

Authors: Hantschel, T Niedermann, P Trenkler, T Vandervorst, W
Citation: T. Hantschel et al., Highly conductive diamond probes for scanning spreading resistance microscopy, APPL PHYS L, 76(12), 2000, pp. 1603-1605

Authors: Beuret, C Akiyama, T Staufer, U de Rooij, NF Niedermann, P Hanni, W
Citation: C. Beuret et al., Conical diamond tips realized by a double-molding process for high-resolution profilometry and atomic force microscopy applications, APPL PHYS L, 76(12), 2000, pp. 1621-1623

Authors: Olbrich, A Ebersberger, B Boit, C Niedermann, P Hanni, W Vancea, J Hoffmann, H
Citation: A. Olbrich et al., High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy, J VAC SCI B, 17(4), 1999, pp. 1570-1574

Authors: Niedermann, P Hanni, W Thurre, S Gjoni, M Perret, A Skinner, N Indermuhle, PF Staufer, U de Rooij, NF
Citation: P. Niedermann et al., Mounting of micromachined diamond tips and cantilevers, SURF INT AN, 27(5-6), 1999, pp. 296-298
Risultati: 1-8 |