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Results: 1-10 |
Results: 10

Authors: SUBRAMANIAN A KENNEL SJ ODEN PI JACOBSON KB WOODWARD J DOKTYCZ MJ
Citation: A. Subramanian et al., COMPARISON OF TECHNIQUES FOR ENZYME IMMOBILIZATION ON SILICON SUPPORTS, Enzyme and microbial technology, 24(1-2), 1999, pp. 26-34

Authors: THUNDAT T ODEN PI WARMACK RJ
Citation: T. Thundat et al., MICROCANTILEVER SENSORS, Microscale thermophysical engineering, 1(3), 1997, pp. 185-199

Authors: CHEN GY WARMACK RJ ODEN PI THUNDAT T
Citation: Gy. Chen et al., TRANSIENT-RESPONSE OF TAPPING SCANNING FORCE MICROSCOPY IN LIQUIDS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1313-1317

Authors: WACHTER EA THUNDAT T ODEN PI WARMACK RJ DATSKOS PG SHARP SL
Citation: Ea. Wachter et al., REMOTE OPTICAL-DETECTION USING MICROCANTILEVERS, Review of scientific instruments, 67(10), 1996, pp. 3434-3439

Authors: WELIPITIYA D HE YL ZHANG JD ODEN PI THUNDAT T WARMACK RJ GOBULUKOGLU I SHAN ZS SELLMYER DJ DOWBEN PA
Citation: D. Welipitiya et al., FABRICATION OF LARGE ARRAYS OF MICRON-SCALE MAGNETIC FEATURES BY SELECTIVE-AREA ORGANOMETALLIC CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 80(3), 1996, pp. 1867-1871

Authors: ODEN PI DATSKOS PG THUNDAT T WARMACK RJ
Citation: Pi. Oden et al., UNCOOLED THERMAL IMAGING USING A PIEZORESISTIVE MICROCANTILEVER, Applied physics letters, 69(21), 1996, pp. 3277-3279

Authors: DATSKOS PG ODEN PI THUNDAT T WACHTER EA WARMACK RJ HUNTER SR
Citation: Pg. Datskos et al., REMOTE INFRARED RADIATION DETECTION USING PIEZORESISTIVE MICROCANTILEVERS, Applied physics letters, 69(20), 1996, pp. 2986-2988

Authors: ODEN PI CHEN GY STEELE RA WARMACK RJ THUNDAT T
Citation: Pi. Oden et al., VISCOUS DRAG MEASUREMENTS UTILIZING MICROFABRICATED CANTILEVERS, Applied physics letters, 68(26), 1996, pp. 3814-3816

Authors: CARNAL D ODEN PI MULLER U SCHMIDT E SIEGENTHALER H
Citation: D. Carnal et al., IN-SITU STM INVESTIGATION OF TL AND PB UNDERPOTENTIAL DEPOSITION ON CHEMICALLY POLISHED AG(111) ELECTRODES, Electrochimica acta, 40(10), 1995, pp. 1223-1235

Authors: ODEN PI TAO NJ LINDSAY SM
Citation: Pi. Oden et al., AU(111) 23X-ROOT-3 SURFACE AS A TEST SURFACE FOR COMPARING THE ATOMICFORCE AND SCANNING TUNNELING MICROSCOPES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 137-140
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