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Results:
1-7
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Results: 7
Authors:
MORLEY S
VONDEREMDE M
ZAHN DRT
OFFERMANN V
NG TL
MAUNG N
WRIGHT AC
FAN GH
POOLE IB
WILLIAMS JO
Citation: S. Morley et al., OPTICAL SPECTROSCOPY OF EPITAXIAL GA2SE3 LAYERS FROM THE FAR-INFRAREDTO THE ULTRAVIOLET, Journal of applied physics, 79(6), 1996, pp. 3196-3199
Authors:
GROSSE P
OFFERMANN V
Citation: P. Grosse et V. Offermann, QUANTITATIVE INFRARED-SPECTROSCOPY OF THIN SOLID AND LIQUID-FILMS UNDER ATTENUATED TOTAL-REFLECTION CONDITIONS, Vibrational spectroscopy, 8(2), 1995, pp. 121-133
Authors:
OFFERMANN V
GROSSE P
FEUERBACHER M
DITTMAR G
Citation: V. Offermann et al., EXPERIMENTAL ASPECTS OF ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY IN THE INFRARED, Vibrational spectroscopy, 8(2), 1995, pp. 135-140
Authors:
THEISS W
WERNKE M
OFFERMANN V
Citation: W. Theiss et al., DEPTH PROFILING OF POROUS SILICON LAYERS BY ATTENUATED TOTAL-REFLECTION SPECTROSCOPY, Thin solid films, 255(1-2), 1995, pp. 181-184
Authors:
KUZIK LA
PETROV YY
YAKOVLEV VA
ZHIZHIN GN
PUDONIN FA
GROSSE P
OFFERMANN V
Citation: La. Kuzik et al., CONDUCTIVITY SPECTRA OF SUPERTHIN NIOBIUM FILMS ON CRYSTALLINE QUARTZAT ROOM AND LOW-TEMPERATURES, Zeitschrift fur Physik. B, Condensed matter, 93(2), 1994, pp. 239-242
Authors:
FRIEDRICH M
MORLEY S
MAINZ B
DEUTSCHMANN S
ZAHN DRT
OFFERMANN V
Citation: M. Friedrich et al., DETECTION OF ULTRATHIN SIC LAYERS BY INFRARED-SPECTROSCOPY, Physica status solidi. a, Applied research, 145(2), 1994, pp. 369-377
Authors:
DITTMAR G
OFFERMANN V
POHLEN M
GROSSE P
Citation: G. Dittmar et al., EXTENSION OF SPECTROSCOPIC ELLIPSOMETRY TO THE FAR-INFRARED, Thin solid films, 234(1-2), 1993, pp. 346-351
Risultati:
1-7
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