Authors:
DEGRAEVE R
GROESENEKEN G
BELLENS R
OGIER JL
DEPAS M
ROUSSEL PJ
MAES HE
Citation: R. Degraeve et al., NEW INSIGHTS IN THE RELATION BETWEEN ELECTRON TRAP GENERATION AND THESTATISTICAL PROPERTIES OF OXIDE BREAKDOWN, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 904-911
Authors:
DEGRAEVE R
OGIER JL
BELLENS R
ROUSSEL PJ
GROESENEKEN G
MAES HE
Citation: R. Degraeve et al., A NEW MODEL FOR THE FIELD-DEPENDENCE OF INTRINSIC AND EXTRINSIC TIME-DEPENDENT DIELECTRIC-BREAKDOWN, I.E.E.E. transactions on electron devices, 45(2), 1998, pp. 472-481
Authors:
DEGRAEVE R
ROUSSEL P
OGIER JL
GROESENEKEN G
MAES HE
Citation: R. Degraeve et al., A NEW STATISTICAL-MODEL FOR FITTING BIMODAL OXIDE BREAKDOWN DISTRIBUTIONS AT DIFFERENT FIELD CONDITIONS, Microelectronics and reliability, 36(11-12), 1996, pp. 1651-1654