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Authors: DEGRAEVE R GROESENEKEN G BELLENS R OGIER JL DEPAS M ROUSSEL PJ MAES HE
Citation: R. Degraeve et al., NEW INSIGHTS IN THE RELATION BETWEEN ELECTRON TRAP GENERATION AND THESTATISTICAL PROPERTIES OF OXIDE BREAKDOWN, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 904-911

Authors: DEGRAEVE R OGIER JL BELLENS R ROUSSEL PJ GROESENEKEN G MAES HE
Citation: R. Degraeve et al., A NEW MODEL FOR THE FIELD-DEPENDENCE OF INTRINSIC AND EXTRINSIC TIME-DEPENDENT DIELECTRIC-BREAKDOWN, I.E.E.E. transactions on electron devices, 45(2), 1998, pp. 472-481

Authors: DEGRAEVE R ROUSSEL P OGIER JL GROESENEKEN G MAES HE
Citation: R. Degraeve et al., A NEW STATISTICAL-MODEL FOR FITTING BIMODAL OXIDE BREAKDOWN DISTRIBUTIONS AT DIFFERENT FIELD CONDITIONS, Microelectronics and reliability, 36(11-12), 1996, pp. 1651-1654
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