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Results: 1-11 |
Results: 11
ELLIPSOMETRIC PARAMETERS AND REFLECTANCES OF THIN-FILMS WITH SLIGHTLYROUGH BOUNDARIES
Authors: FRANTA D OHLIDAL I
Citation: D. Franta et I. Ohlidal, ELLIPSOMETRIC PARAMETERS AND REFLECTANCES OF THIN-FILMS WITH SLIGHTLYROUGH BOUNDARIES, J. mod. opt., 45(5), 1998, pp. 903-934
OPTICAL-PARAMETER ANALYSIS OF THIN ABSORBING FILMS MEASURED BY THE PHOTOVOLTAGE METHOD
Authors: PAVELKA R HLAVKA J OHLIDAL I SITTER H
Citation: R. Pavelka et al., OPTICAL-PARAMETER ANALYSIS OF THIN ABSORBING FILMS MEASURED BY THE PHOTOVOLTAGE METHOD, Acta Physica Polonica. A, 94(3), 1998, pp. 468-472
PARAMETERIZATION OF THE MODEL OF DISPERSION DEPENDENCES OF SOLID-STATE OPTICAL-CONSTANTS
Authors: FRANTA D OHLIDAL I MUNZAR D
Citation: D. Franta et al., PARAMETERIZATION OF THE MODEL OF DISPERSION DEPENDENCES OF SOLID-STATE OPTICAL-CONSTANTS, Acta physica slovaca, 48(4), 1998, pp. 451-458
ELLIPSOMETRY OF THIN-FILMS
Authors: OHLIDAL I FRANTA D
Citation: I. Ohlidal et D. Franta, ELLIPSOMETRY OF THIN-FILMS, Acta physica slovaca, 48(4), 1998, pp. 459-468
STATISTICAL PROPERTIES OF THE NEAR-FIELD SPECKLE PATTERNS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES
Authors: FRANTA D OHLIDAL I
Citation: D. Franta et I. Ohlidal, STATISTICAL PROPERTIES OF THE NEAR-FIELD SPECKLE PATTERNS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES, Optics communications, 147(4-6), 1998, pp. 349-358
ANALYSIS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES
Authors: OHLIDAL I FRANTA D HORA J NAVRATIL K WEBER J JANDA P
Citation: I. Ohlidal et al., ANALYSIS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES, Mikrochimica acta (1966), 1998, pp. 177-180
PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION OF THIN-FILMS FROM TETRAETHOXYSILANE AND METHANOL - OPTICAL-PROPERTIES AND XPS ANALYSES
Authors: ZAJICKOVA L OHLIDAL I JANCA J
Citation: L. Zajickova et al., PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION OF THIN-FILMS FROM TETRAETHOXYSILANE AND METHANOL - OPTICAL-PROPERTIES AND XPS ANALYSES, Thin solid films, 280(1-2), 1996, pp. 26-36
NEW TECHNIQUE OF MEASUREMENT OF OPTICAL-PARAMETERS OF THIN-FILMS
Authors: HLAVKA J OHLIDAL I VIZDA F SITTER H
Citation: J. Hlavka et al., NEW TECHNIQUE OF MEASUREMENT OF OPTICAL-PARAMETERS OF THIN-FILMS, Thin solid films, 279(1-2), 1996, pp. 209-212
OPTICAL ANALYSIS BY MEANS OF SPECTROSCOPIC REFLECTOMETRY OF SINGLE AND DOUBLE-LAYERS WITH CORRELATED RANDOMLY ROUGH BOUNDARIES
Authors: OHLIDAL I VIZDA F OHLIDAL M
Citation: I. Ohlidal et al., OPTICAL ANALYSIS BY MEANS OF SPECTROSCOPIC REFLECTOMETRY OF SINGLE AND DOUBLE-LAYERS WITH CORRELATED RANDOMLY ROUGH BOUNDARIES, Optical engineering, 34(6), 1995, pp. 1761-1768
CHARACTERIZATION OF THE BASIC STATISTICAL PROPERTIES OF VERY ROUGH SURFACES OF TRANSPARENT SOLIDS BY IMMERSION SHEARING INTERFEROMETRY
Authors: OHLIDAL I NAVRATIL K OHLIDAL M DRUCKMULLER M
Citation: I. Ohlidal et al., CHARACTERIZATION OF THE BASIC STATISTICAL PROPERTIES OF VERY ROUGH SURFACES OF TRANSPARENT SOLIDS BY IMMERSION SHEARING INTERFEROMETRY, Applied optics, 33(34), 1994, pp. 7838-7845
X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS
Authors: HOLY V KUBENA J OHLIDAL I LISCHKA K PLOTZ W
Citation: V. Holy et al., X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS, Physical review. B, Condensed matter, 47(23), 1993, pp. 15896-15903
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