Authors:
BRAECKELMANN G
MANGER D
BURKE A
PETERSON GG
KALOYEROS AE
REIDSEMA C
OMSTEAD TR
LOAN JF
SULLIVAN JJ
Citation: G. Braeckelmann et al., CHEMICAL-VAPOR-DEPOSITION OF COPPER FROM CU-I HEXAFLUOROACETYLACETONATE TRIMETHYLVINYLSILANE FOR ULTRALARGE SCALE INTEGRATION APPLICATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1828-1836
Authors:
PARMETER JE
PETERSEN GA
SMITH PM
APBLETT CA
REID JS
NORMAN JAT
HOCHBERG AK
ROBERTS DA
OMSTEAD TR
Citation: Je. Parmeter et al., CHARACTERIZATION OF THIN COPPER-FILMS GROWN VIA CHEMICAL-VAPOR-DEPOSITION USING LIQUID COINJECTION OF TRIMETHYLVINYLSILANE AND (HEXAFLUOROACETYLACETONATE) CU (TRIMETHYLVINYLSILANE), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(1), 1995, pp. 130-136
Authors:
PETERSEN GA
PARMETER JE
APBLETT CA
GONZALES MF
SMITH PM
OMSTEAD TR
NORMAN JAT
Citation: Ga. Petersen et al., ENHANCED CHEMICAL-VAPOR-DEPOSITION OF COPPER FROM (HFAC)CU(TMVS) USING LIQUID COINJECTION OF TMVS, Journal of the Electrochemical Society, 142(3), 1995, pp. 939-944