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Results: 1-19 |
Results: 19

Authors: DU M OPILA RL CASE C
Citation: M. Du et al., INTERFACE FORMATION BETWEEN METALS (CU, TI) AND LOW DIELECTRIC-CONSTANT ORGANIC POLYMER (FLARE(TM)-1.0), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 155-162

Authors: OPILA RL LEGRANGE JD MARKHAM JL HEYER G SCHROEDER CM
Citation: Rl. Opila et al., EFFECTS OF SURFACE HYDRATION ON THE DEPOSITION OF SILANE MONOLAYERS ON SILICA OPTICAL-FIBER, Journal of adhesion science and technology, 11(1), 1997, pp. 1-10

Authors: HONG M PASSLACK M MANNAERTS JP HARRIS TD SCHNOES ML OPILA RL KRAUTTER HW
Citation: M. Hong et al., A GA2O3 PASSIVATION TECHNIQUE COMPATIBLE WITH GAAS DEVICE PROCESSING, Solid-state electronics, 41(4), 1997, pp. 643-646

Authors: PASSLACK M HONG M MANNAERTS JP OPILA RL CHU SNG MORIYA N REN F KWO JR
Citation: M. Passlack et al., LOW D-IT, THERMODYNAMICALLY STABLE GA2O3-GAAS INTERFACES - FABRICATION, CHARACTERIZATION, AND MODELING, I.E.E.E. transactions on electron devices, 44(2), 1997, pp. 214-225

Authors: PASSLACK M HONG M OPILA RL MANNAERTS JP KWO JR
Citation: M. Passlack et al., GAAS SURFACE PASSIVATION USING IN-SITU OXIDE DEPOSITION, Applied surface science, 104, 1996, pp. 441-447

Authors: FIORINO ME OPILA RL KONSTADINIDAS K FANG WC
Citation: Me. Fiorino et al., ELECTROCHEMICAL AND X-RAY PHOTOELECTRON-SPECTROSCOPY CHARACTERIZATIONOF SURFACE-FILMS ON MMNI(3.5)AL(0.8)CO(0.7), Journal of the Electrochemical Society, 143(8), 1996, pp. 2422-2428

Authors: PASSLACK M HONG MW MANNAERTS JP OPILA RL REN F
Citation: M. Passlack et al., THERMODYNAMIC AND PHOTOCHEMICAL STABILITY OF LOW INTERFACE STATE DENSITY GA2O3-GAAS STRUCTURES FABRICATED BY IN-SITU MOLECULAR-BEAM EPITAXY, Applied physics letters, 69(3), 1996, pp. 302-304

Authors: COMIZZOLI RB FRANKENTHAL RP HANSON KJ KONSTADINIDIS K OPILA RL SAPJETA J SINCLAIR JD TAKAHASHI KM FRANK AL IBIDUNNI AO
Citation: Rb. Comizzoli et al., ELECTROCHEMICAL ASPECTS OF CORROSION-RESISTANCE AND ETCHING OF METALLIZATIONS FOR MICROELECTRONICS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 198(1-2), 1995, pp. 153-160

Authors: KONSTADINIDIS K ZHANG P OPILA RL ALLARA DL
Citation: K. Konstadinidis et al., AN IN-SITU X-RAY PHOTOELECTRON STUDY OF THE INTERACTION BETWEEN VAPOR-DEPOSITED TI ATOMS AND FUNCTIONAL-GROUPS AT THE SURFACES OF SELF-ASSEMBLED MONOLAYERS, Surface science, 338(1-3), 1995, pp. 300-312

Authors: LYONS KB HEBARD AF INNIS D OPILA RL CARTER HL HADDON RC
Citation: Kb. Lyons et al., PHOTOINDUCED CROSS-LINKING AND DECOMPOSITION OF C-60 IN THE PRESENCE OF NITRIC-OXIDE (NO), Journal of physical chemistry, 99(45), 1995, pp. 16516-16518

Authors: CHAND N KOLA RR OPILA RL COMIZZOLI RB KRAUTTER H SERGENT AM TSANG WT OSENBACH JW LUFTMAN HS
Citation: N. Chand et al., STRESS-FREE AND MOISTURE INSENSITIVE SILICON-OXIDE DIELECTRIC FILMS FORMED BY MOLECULAR-BEAM DEPOSITION, Journal of applied physics, 78(5), 1995, pp. 3315-3322

Authors: KONSTADINIDIS K PAPADIMITRAKOPOULOS F GALVIN M OPILA RL
Citation: K. Konstadinidis et al., IN-SITU X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF ALUMINUM POLY (P-PHENYLENEVINYLENE) INTERFACES/, Journal of applied physics, 77(11), 1995, pp. 5642-5646

Authors: OPILA RL KRAUTIER HW ZEGARSKI BR DUBOIS LH WENGER G
Citation: Rl. Opila et al., THERMAL-STABILITY OF AZOLE-COATED COPPER SURFACES, Journal of the Electrochemical Society, 142(12), 1995, pp. 4074-4077

Authors: KONSTADINIDIS K OPILA RL TAYLOR JA MILLER AC
Citation: K. Konstadinidis et al., X-RAY PHOTOELECTRON STUDY OF CHEMICAL INTERACTIONS AT TI POLYMER INTERFACES/, The Journal of adhesion, 46(1-4), 1994, pp. 197-213

Authors: SCHUBERT EF PASSLACK M HONG M MANNERTS J OPILA RL PFEIFFER LN WEST KW BETHEA CG ZYDZIK GJ
Citation: Ef. Schubert et al., PROPERTIES OF AL2O3 OPTICAL COATINGS ON GAAS PRODUCED BY OXIDATION OFEPITAXIAL ALAS GAAS FILMS/, Applied physics letters, 64(22), 1994, pp. 2976-2978

Authors: PASSLACK M HUNT NEJ SCHUBERT EF ZYDZIK GJ HONG M MANNAERTS JP OPILA RL FISCHER RJ
Citation: M. Passlack et al., DIELECTRIC-PROPERTIES OF ELECTRON-BEAM DEPOSITED GA2O3 FILMS, Applied physics letters, 64(20), 1994, pp. 2715-2717

Authors: OPILA RL
Citation: Rl. Opila, CAREFULLY PLAN DUST COLLECTION SYSTEMS, Chemical engineering progress, 89(5), 1993, pp. 22-27

Authors: GREGUS JA VERNON MF GOTTSCHO RA SCHELLER GR HOBSON WS OPILA RL YOON E
Citation: Ja. Gregus et al., LOW-TEMPERATURE PLASMA-ETCHING OF GAAS, ALGAAS, AND ALAS, Plasma chemistry and plasma processing, 13(3), 1993, pp. 521-537

Authors: IBIDUNNI AO MASAITIS RL OPILA RL DAVENPORT AJ ISAACS HS TAYLOR JA
Citation: Ao. Ibidunni et al., CHARACTERIZATION OF THE OXIDATION OF TANTALUM NITRIDE, Surface and interface analysis, 20(7), 1993, pp. 559-564
Risultati: 1-19 |