Authors:
FENLON HM
PHELAN NC
OSULLIVAN P
TIERNEY S
GOREY TF
ENNIS JT
Citation: Hm. Fenlon et al., SCINTIMAMMOGRAPHY AND MR MAMMOGRAPHY IN ASSESSING PALPABLE BREAST MASSES AND RECURRENT TUMOR, European journal of cancer, 34, 1998, pp. 24-24
Citation: A. Martin et al., DEPENDENCE OF GATE OXIDE BREAKDOWN ON INITIAL CHARGE TRAPPING UNDER FOWLER-NORDHEIM INJECTION, Microelectronics and reliability, 38(6-8), 1998, pp. 1091-1096
Authors:
BECK C
FRANK L
CHUMBLER NR
OSULLIVAN P
VOGELPOHL TS
RASIN J
WALLS R
BALDWIN B
Citation: C. Beck et al., CORRELATES OF DISRUPTIVE BEHAVIOR IN SEVERELY COGNITIVELY IMPAIRED NURSING-HOME RESIDENTS, The Gerontologist, 38(2), 1998, pp. 189-198
Authors:
TIERNEY S
FENLON HM
PHELAN N
OSULLIVAN P
ENNIS JT
GOREY TF
Citation: S. Tierney et al., SCINTIMAMMOGRAPHY IN THE ASSESSMENT OF LOCAL RECURRENCE FOLLOWING CONSERVATIVE BREAST SURGERY, British Journal of Surgery, 85, 1998, pp. 51-51
Authors:
OBRIEN GM
STEIN MD
ZIERLER S
SHAPIRO M
OSULLIVAN P
WOOLARD R
Citation: Gm. Obrien et al., USE OF THE ED AS A REGULAR SOURCE OF CARE - ASSOCIATED FACTORS BEYONDLACK OF HEALTH-INSURANCE, Annals of emergency medicine, 30(3), 1997, pp. 286-291
Citation: Bc. Vaughanwrobel et al., EVALUATING CRITICAL THINKING SKILLS OF BACCALAUREATE NURSING-STUDENTS, The Journal of nursing education, 36(10), 1997, pp. 485-488
Authors:
MARTIN A
OSULLIVAN P
MATHEWSON A
SUEHLE JS
CHAPARALA P
Citation: A. Martin et al., INVESTIGATION OF THE INFLUENCE OF RAMPED VOLTAGE STRESS ON INTRINSIC T(BD) OF MOS GATE OXIDES, Solid-state electronics, 41(7), 1997, pp. 1013-1020
Authors:
FENLON HM
PHELAN NC
OSULLIVAN P
TIERNEY S
GOREY T
ENNIS JT
Citation: Hm. Fenlon et al., BENIGN VERSUS MALIGNANT BREAST DISEASE - COMPARISON OF CONTRAST-ENHANCED MR-IMAGING AND TC-99M TETROFOSMIN SCINTIMAMMOGRAPHY, Radiology, 205(1), 1997, pp. 214-220
Citation: A. Martin et al., STUDY OF UNIPOLAR PULSED RAMP AND COMBINED RAMPED CONSTANT VOLTAGE STRESS ON MOS GATE OXIDES/, Microelectronics and reliability, 37(7), 1997, pp. 1045-1051
Authors:
MINEHANE S
HEALY S
OSULLIVAN P
MCCARTHY K
MATHEWSON A
MASON B
Citation: S. Minehane et al., DIRECT PARAMETER EXTRACTION FOR HOT-CARRIER RELIABILITY SIMULATION, Microelectronics and reliability, 37(10-11), 1997, pp. 1437-1440
Citation: H. Wilson et al., POLICY AND LEGISLATION RELEVANT TO THE CONSERVATION OF FRESH-WATER SSSIS SUBJECT TO EUTROPHICATION, Journal of the Chartered Institution of Water and Environmental Management, 10(5), 1996, pp. 348-354
Citation: Ej. Wiseman et al., RELATION OF DENIAL OF ALCOHOL-PROBLEMS TO NEUROCOGNITIVE IMPAIRMENT AND DEPRESSION, Psychiatric services, 47(3), 1996, pp. 306-308
Authors:
SOUDER E
HEITHOFF K
OSULLIVAN P
LANCASTER E
Citation: E. Souder et al., DIAGNOSIS AND DISRUPTIVE BEHAVIOR IN INSTITUTIONALIZED ELDERLY SUBJECTS, The American journal of geriatric psychiatry, 4(4), 1996, pp. 352-352
Citation: A. Martin et al., INVESTIGATION OF RELIABILITY MEASUREMENTS WITH RAMPED AND CONSTANT VOLTAGE STRESS ON MOS GATE OXIDES, Quality and reliability engineering international, 12(4), 1996, pp. 281-286
Citation: P. Osullivan et al., AMINOHYDROXAMIC ACIDS AS METAL SEQUESTERING AGENTS - COPPER(II) AND NICKEL(II) COMPLEXES OF NTANAMIDE,2-AMINO-4-METHYLTHIO-N-HYDROXYBUTANAMIDE IN AQUEOUS-SOLUTION, Journal of coordination chemistry, 38(4), 1996, pp. 271-280
Authors:
STEIN MD
WILKINSON J
BERGLAS N
OSULLIVAN P
Citation: Md. Stein et al., PREVALENCE AND DETECTION OF ILLICIT DRUG DISORDERS AMONG HOSPITALIZED-PATIENTS, The American journal of drug and alcohol abuse, 22(3), 1996, pp. 463-471
Authors:
DRUMMOND SS
DANCER J
CASEY BE
OSULLIVAN P
Citation: Ss. Drummond et al., VISUAL RECOGNITION TRAINING OF OLDER ADULTS WITH SPEECH SPECTROGRAMS, Perceptual and motor skills, 82(2), 1996, pp. 379-382
Authors:
DUANE R
MARTIN A
ODONOVAN P
HURLEY P
OSULLIVAN P
MATHEWSON A
Citation: R. Duane et al., INVESTIGATION OF TRAPPED CHARGE IN OXIDES UNDER FOWLER-NORDHEIM STRESS USING LOW-BIAS CONDITIONS, Microelectronics and reliability, 36(11-12), 1996, pp. 1623-1626
Authors:
MARTIN A
RIBBROCK T
OSULLIVAN P
MATHEWSON A
Citation: A. Martin et al., ENHANCEMENT OF T(BD) OF MOS GATE OXIDES WITH A SINGLE-STEP PRE-STRESSPRIOR TO A CVS IN THE FOWLER-NORDHEIM REGIME, Microelectronics and reliability, 36(11-12), 1996, pp. 1647-1650