Citation: S. Yoshimoto et al., A new sample structure for position-controlled giant-grain growth of silicon using phase-modulated excimer-laser annealing, JPN J A P 1, 40(7), 2001, pp. 4466-4469
Citation: Wj. Joo et al., Photoinduced birefringence in poly(malonic ester) containing p-cyanoazobenzene with photoexcitation of cis conformer, J PHYS CH B, 105(35), 2001, pp. 8322-8326
Authors:
Chen, JL
Kaszlikowski, D
Kwek, LC
Oh, CH
Zukowski, M
Citation: Jl. Chen et al., Entangled three-state systems violate local realism more strongly than qubits: An analytical proof - art. no. 052109, PHYS REV A, 6405(5), 2001, pp. 2109
Citation: S. Park et al., Ray-optical determination of the coupling coefficients of grating waveguide by use of the rigorous coupled-wave theory, J LIGHTW T, 19(1), 2001, pp. 120-125
Citation: Yy. Lee et al., Ion trap mass spectrometer simulation for multi-ions based on an exact expression for the collision probability, J KOR PHYS, 39(5), 2001, pp. 902-906
Authors:
Oh, CH
Levine, MS
Katzka, DA
Rubesin, SE
Pinheiro, LW
Amygdalos, MA
Laufer, I
Citation: Ch. Oh et al., Congenital esophageal stenosis in adults: Clinical and radiographic findings in seven patients, AM J ROENTG, 176(5), 2001, pp. 1179-1182
Citation: Ch. Oh et al., Regio- and stereoselectivity in palladium-catalyzed cycloreductions of 1,6-enynes in the presence of formic acid or triethylsilane, TETRAHEDRON, 57(9), 2001, pp. 1723-1729
Citation: Ch. Oh et al., Highly regio- and stereoselective cycloreductions of 1,6-and 1,7-enynes activated with a carbonyl functionality, ANGEW CHEM, 39(4), 2000, pp. 752
Citation: Lc. Kwek et al., Analytic expression for exact-ground-state energy based on an operator method for a class of anharmonic potentials - art. no. 052107, PHYS REV A, 6205(5), 2000, pp. 2107
Citation: Ml. Ge et al., Unified approach for exactly solvable potentials in quantum mechanics using shift operators - art. no. 052110, PHYS REV A, 6205(5), 2000, pp. 2110
Citation: Lc. Kwek et al., Buzek-Hillery cloning revisited using the bures metric and trace norm - art. no. 052313, PHYS REV A, 6205(5), 2000, pp. 2313