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Results: 1-25 | 26-29
Results: 1-25/29
CAPILLARY-WAVE ROUGHENING OF SURFACE-INDUCED LAYERING IN LIQUID GALLIUM (VOL 54, PG 9730, 1996)
Authors: REGAN MJ PERSHAN PS MAGNUSSEN OM OCKO BM DEUTSCH M BERMAN LE
Citation: Mj. Regan et al., CAPILLARY-WAVE ROUGHENING OF SURFACE-INDUCED LAYERING IN LIQUID GALLIUM (VOL 54, PG 9730, 1996), Physical review. B, Condensed matter, 57(9), 1998, pp. 5541-5541
X-RAY MEASUREMENTS OF NONCAPILLARY SPATIAL FLUCTUATIONS FROM A LIQUIDSURFACE
Authors: FUKUTO M HEILMANN RK PERSHAN PS GRIFFITHS JA YU SM TIRRELL DA
Citation: M. Fukuto et al., X-RAY MEASUREMENTS OF NONCAPILLARY SPATIAL FLUCTUATIONS FROM A LIQUIDSURFACE, Physical review letters, 81(16), 1998, pp. 3455-3458
SURFACE PHASES IN BINARY-LIQUID METAL-ALLOYS - AN X-RAY STUDY
Authors: TOSTMANN H DIMASI E SHPYRKO OG PERSHAN PS OCKO BM DEUTSCH M
Citation: H. Tostmann et al., SURFACE PHASES IN BINARY-LIQUID METAL-ALLOYS - AN X-RAY STUDY, Berichte der Bunsengesellschaft fur Physikalische Chemie, 102(9), 1998, pp. 1136-1141
MODEL-INDEPENDENT RECONSTRUCTION OF SMOOTH ELECTRON-DENSITY PROFILES FROM REFLECTIVITY DATA OF LIQUID SURFACES
Authors: CHOU CH REGAN MJ PERSHAN PS ZHOU XL
Citation: Ch. Chou et al., MODEL-INDEPENDENT RECONSTRUCTION OF SMOOTH ELECTRON-DENSITY PROFILES FROM REFLECTIVITY DATA OF LIQUID SURFACES, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 55(6), 1997, pp. 7212-7216
X-RAY REFLECTIVITY STUDIES OF LIQUID-METAL AND ALLOY SURFACES
Authors: REGAN MJ PERSHAN PS MAGNUSSEN OM OCKO BM DEUTSCH M BERMAN LE
Citation: Mj. Regan et al., X-RAY REFLECTIVITY STUDIES OF LIQUID-METAL AND ALLOY SURFACES, Physical review. B, Condensed matter, 55(23), 1997, pp. 15874-15884
X-RAY STUDY OF THE OXIDATION OF LIQUID-GALLIUM SURFACES
Authors: REGAN MJ TOSTMANN H PERSHAN PS MAGNUSSEN OM DIMASI E OCKO BM DEUTSCH M
Citation: Mj. Regan et al., X-RAY STUDY OF THE OXIDATION OF LIQUID-GALLIUM SURFACES, Physical review. B, Condensed matter, 55(16), 1997, pp. 10786-10790
C-60-PROPYLAMINE ADDUCT MONOLAYERS AT THE GAS WATER INTERFACE - A BREWSTER-ANGLE MICROSCOPY AND X-RAY-SCATTERING STUDY/
Authors: FUKUTO M PENANEN K HEILMANN RK PERSHAN PS VAKNIN D
Citation: M. Fukuto et al., C-60-PROPYLAMINE ADDUCT MONOLAYERS AT THE GAS WATER INTERFACE - A BREWSTER-ANGLE MICROSCOPY AND X-RAY-SCATTERING STUDY/, The Journal of chemical physics, 107(14), 1997, pp. 5531-5546
EVIDENCE OF ANNEALING EFFECTS ON A HIGH-DENSITY SI SIO2 INTERFACIAL LAYER/
Authors: KOSOWSKY SD PERSHAN PS KRISCH KS BEVK J GREEN ML BRASEN D FELDMAN LC ROY PK
Citation: Sd. Kosowsky et al., EVIDENCE OF ANNEALING EFFECTS ON A HIGH-DENSITY SI SIO2 INTERFACIAL LAYER/, Applied physics letters, 70(23), 1997, pp. 3119-3121
X-RAY REFLECTIVITY STUDIES OF THE SURFACE-STRUCTURE OF LIQUID-METALS
Authors: MAGNUSSEN OM REGAN MJ KAWAMOTO EH OCKO BM PERSHAN PS MASKIL N DEUTSCH M LEE S PENANEN K BERMAN LE
Citation: Om. Magnussen et al., X-RAY REFLECTIVITY STUDIES OF THE SURFACE-STRUCTURE OF LIQUID-METALS, Physica. B, Condensed matter, 221(1-4), 1996, pp. 257-260
LIQUID SURFACE ORDER - X-RAY REFLECTIVITY
Authors: PERSHAN PS
Citation: Ps. Pershan, LIQUID SURFACE ORDER - X-RAY REFLECTIVITY, Physica. A, 231(1-3), 1996, pp. 111-116
CAPILLARY-WAVE ROUGHENING OF SURFACE-INDUCED LAYERING IN LIQUID GALLIUM
Authors: REGAN MJ PERSHAN PS MAGNUSSEN OM OCKO BM DEUTSCH M BERMAN LE
Citation: Mj. Regan et al., CAPILLARY-WAVE ROUGHENING OF SURFACE-INDUCED LAYERING IN LIQUID GALLIUM, Physical review. B, Condensed matter, 54(14), 1996, pp. 9730-9733
SELF-ASSEMBLY OF ORGANIC FILMS ON A LIQUID-METAL
Authors: MAGNUSSEN OM OCKO BM DEUTSCH M REGAN MJ PERSHAN PS ABERNATHY D GRUBEL G LEGRAND JF
Citation: Om. Magnussen et al., SELF-ASSEMBLY OF ORGANIC FILMS ON A LIQUID-METAL, Nature, 384(6606), 1996, pp. 250-252
X-RAY STUDIES OF ATOMIC LAYERING AT LIQUID-METAL SURFACES
Authors: REGAN MJ MAGNUSSEN OM KAWAMOTO EH PERSHAN PS OCKO BM MASKIL N DEUTSCH M LEE S PENANEN K BERMAN LE
Citation: Mj. Regan et al., X-RAY STUDIES OF ATOMIC LAYERING AT LIQUID-METAL SURFACES, Journal of non-crystalline solids, 207, 1996, pp. 762-766
THE STRUCTURE OF A LANGMUIR MONOLAYER OF METHYL EICOSANOATE AS DETERMINED BY X-RAY-DIFFRACTION AND BREWSTER-ANGLE MICROSCOPY
Authors: FOSTER WJ SHIH MC PERSHAN PS
Citation: Wj. Foster et al., THE STRUCTURE OF A LANGMUIR MONOLAYER OF METHYL EICOSANOATE AS DETERMINED BY X-RAY-DIFFRACTION AND BREWSTER-ANGLE MICROSCOPY, The Journal of chemical physics, 105(8), 1996, pp. 3307-3315
A DETERMINATION OF THE PHASE-DIAGRAM OF RELAXED LANGMUIR MONOLAYERS OF BEHENIC ACID
Authors: BOMMARITO GM FOSTER WJ PERSHAN PS SCHLOSSMAN ML
Citation: Gm. Bommarito et al., A DETERMINATION OF THE PHASE-DIAGRAM OF RELAXED LANGMUIR MONOLAYERS OF BEHENIC ACID, The Journal of chemical physics, 105(12), 1996, pp. 5265-5284
X-RAY REFLECTIVITY MEASUREMENTS AND LANDAU THEORY OF SMECTIC WETTING IN LIQUID CRYSTAL-BENZYL ALCOHOL MIXTURES
Authors: KELLOGG GJ PERSHAN PS KAWAMOTO EH FOSTER WF DEUTSCH M OCKO BM
Citation: Gj. Kellogg et al., X-RAY REFLECTIVITY MEASUREMENTS AND LANDAU THEORY OF SMECTIC WETTING IN LIQUID CRYSTAL-BENZYL ALCOHOL MIXTURES, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 51(5), 1995, pp. 4709-4726
AN X-RAY-SCATTERING STUDY OF SIOX SI GE(001)
Authors: KOSOWSKY SD HSU CH PERSHAN PS BEVK J FREER BS
Citation: Sd. Kosowsky et al., AN X-RAY-SCATTERING STUDY OF SIOX SI GE(001), Applied surface science, 84(2), 1995, pp. 179-185
SURFACE LAYERING IN LIQUID GALLIUM - AN X-RAY REFLECTIVITY STUDY
Authors: REGAN MJ KAWAMOTO EH LEE S PERSHAN PS MASKIL N DEUTSCH M MAGNUSSEN OM OCKO BM BERMAN LE
Citation: Mj. Regan et al., SURFACE LAYERING IN LIQUID GALLIUM - AN X-RAY REFLECTIVITY STUDY, Physical review letters, 75(13), 1995, pp. 2498-2501
X-RAY REFLECTIVITY MEASUREMENTS OF SURFACE LAYERING IN LIQUID MERCURY
Authors: MAGNUSSEN OM OCKO BM REGAN MJ PENANEN K PERSHAN PS DEUTSCH M
Citation: Om. Magnussen et al., X-RAY REFLECTIVITY MEASUREMENTS OF SURFACE LAYERING IN LIQUID MERCURY, Physical review letters, 74(22), 1995, pp. 4444-4447
X-RAY-INDUCED ELECTROSTATIC CHARGING OF HELIUM FILMS
Authors: PENANEN K PERSHAN PS REGAN MJ SILVERA IF
Citation: K. Penanen et al., X-RAY-INDUCED ELECTROSTATIC CHARGING OF HELIUM FILMS, Journal of low temperature physics, 101(3-4), 1995, pp. 489-494
X-RAY OR NEUTRON REFLECTIVITY - LIMITATIONS IN THE DETERMINATION OF INTERFACIAL PROFILES
Authors: PERSHAN PS
Citation: Ps. Pershan, X-RAY OR NEUTRON REFLECTIVITY - LIMITATIONS IN THE DETERMINATION OF INTERFACIAL PROFILES, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 50(3), 1994, pp. 2369-2372
THE EFFECTS OF SURFACE PROFILE AND INTERFACE CORRELATIONS ON X-RAY REFLECTIVITY FROM FLUID INTERFACES
Authors: PERSHAN PS
Citation: Ps. Pershan, THE EFFECTS OF SURFACE PROFILE AND INTERFACE CORRELATIONS ON X-RAY REFLECTIVITY FROM FLUID INTERFACES, Journal of physics. Condensed matter, 6, 1994, pp. 10000037-10000050
X-RAY AND ELLIPSOMETRIC STUDIES OF SELF-ASSEMBLED MONOLAYERS OF FLUORINATED CHLOROSILANES
Authors: GEER RE STENGER DA CHEN MS CALVERT JM SHASHIDHAR R JEONG YH PERSHAN PS
Citation: Re. Geer et al., X-RAY AND ELLIPSOMETRIC STUDIES OF SELF-ASSEMBLED MONOLAYERS OF FLUORINATED CHLOROSILANES, Langmuir, 10(4), 1994, pp. 1171-1176
LIQUID-VAPOR DENSITY PROFILE OF HELIUM - AN X-RAY STUDY (VOL 68, PG 2628, 1992)
Authors: LURIO LB RABEDEAU TA PERSHAN PS SILVERA IF DEUTSCH M KOSOWSKY SD OCKO BM
Citation: Lb. Lurio et al., LIQUID-VAPOR DENSITY PROFILE OF HELIUM - AN X-RAY STUDY (VOL 68, PG 2628, 1992), Physical review letters, 72(2), 1994, pp. 309-309
X-RAY STUDIES OF THE THICKNESS AND ROUGHNESS OF THIN ADSORBED FLUID LAYERS
Authors: PERSHAN PS
Citation: Ps. Pershan, X-RAY STUDIES OF THE THICKNESS AND ROUGHNESS OF THIN ADSORBED FLUID LAYERS, Berichte der Bunsengesellschaft fur Physikalische Chemie, 98(3), 1994, pp. 372-375
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